BS CECC 50000:1987

$215.11

Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices

Published By	Publication Date	Number of Pages
BSI	1987	96

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Categories: 31.080.99 - Other semiconductor devices, BSI

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Description

Applies to diodes, transistors, rectifier diodes and thyristors. Specifies quality assessment and test and measurement conditions. Appendices on structural similarity, inspection requirements, tests and screening.

Additional information

Status	Definitive
Pages	96
Publication Date	1987-10-30
ISBN	0 580 16263 X
Standard Number	BS CECC 50000:1987
Title	Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Identical National Standard Of	CECC 50000:1986
Replaces	BS 9300:1969, BS CECC 50000:1981
Descriptors	Electrical measurement, Orientation, Heat of activation, Inspection, Accelerated testing, Capacitance measurement, Breakdown voltage, Sampling methods, Quality assurance systems, Transistors, Marking, Semiconductor diodes, Capability approval, Electrical testing, Test equipment, Semiconductor rectifiers, Thyristors, Circuits, Designations, Testing conditions, Acceptance (approval), Thermal testing, Noise (spurious signals), Mechanical testing, Approval testing, Electronic equipment and components, Environmental testing, Qualification approval, Performance testing, Semiconductor devices, Voltage measurement, Transient voltages, Current measurement, Colour codes, Visual inspection (testing), Power measurement (electric), Statistical quality control, Assessed quality, Specification (approval), Endurance testing, Quality control, Leak tests
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.99 - Other semiconductor devices

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BS CECC 50000:1987

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