BS EN 60749-36:2003

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Semiconductor devices. Mechanical and climatic test methods – Acceleration, steady state

Published By	Publication Date	Number of Pages
BSI	2003	8

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Additional information

Status	Definitive
Pages	8
Publication Date	2003-06-19
ISBN	0 580 42065 5
Partially Replaces	BS EN 60749:1999
Standard Number	BS EN 60749-36:2003
Title	Semiconductor devices. Mechanical and climatic test methods – Acceleration, steady state
Identical National Standard Of	IEC 60749-36:2003, EN 60749-36:2003
Descriptors	Endurance testing, Integrated circuits, Impact testing, Semiconductor devices, Mechanical testing, Electronic equipment and components, Acceleration measurement, Acceleration tests, Climate, Environmental testing, Stress, Destructive testing
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-36:2003

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BS EN 60749-36:2003

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