IEC 60748-23-4:2002
$33.15
Semiconductor devices – Integrated circuits – Part 23-4: Hybrid integrated circuits and film structures – Manufacturing line certification – Blank detail specification
Published By | Publication Date | Number of Pages |
IEC | 2002-05-17 | 26 |
If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]
Serves as a Blank Detail Specification for a high quality approval system and contains requirements for style and layout and minimum content of detail specifications. These requirements are applicable when the detail specification is published.
Published Code | IEC |
---|---|
Published By | International Electrotechnical Commission |
Publication Date | 2002-05-17 |
Pages Count | 26 |
Language | English |
Edition | 1.0 |
File Size | 409.6 KB |
ICS Codes | 31.200 - Integrated circuits. Microelectronics |
Related products
-
BS EN 60749-13:2002
Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere Published By Publication Date Number…
-
BS EN IEC 62787:2021
Concentrator photovoltaic (CPV) solar cells and cell on carrier (CoC) assemblies. Qualification Published By Publication…
-
BS EN 60749-10:2002
Semiconductor devices. Mechanical and climatic test methods – Mechanical shock Published By Publication Date Number…
-
BS IEC 60748-23-3:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification – Manufacturers’…
-
BS EN 60745-2-17:2010:2011 Edition
Hand-held motor-operated electric tools. Safety – Particular requirements for routers and trimmers Published By Publication…
-
BS EN 60749-39:2006
Semiconductor devices. Mechanical and climatic test methods – Measurement of moisture diffusivity and water solubility…
-
BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods – High temperature operating life Published By Publication…
-
IEC 60748-23-3:2002
Semiconductor devices – Integrated circuits – Part 23-3: Hybrid integrated circuits and film structures –…
-
BS EN 60749-15:2010:2011 Edition
Semiconductor devices. Mechanical and climatic test methods – Resistance to soldering temperature for through-hole mounted…
-
BS EN 60745-2-23:2013
Hand-held motor-operated electric tools. Safety – Particular requirements for die grinders and small rotary tools…
-
BS EN 60749-12:2002
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…
-
BS EN IEC 60747-17:2020:2021 Edition
Semiconductor devices – Magnetic and capacitive coupler for basic and reinforced insulation Published By Publication…
-
BS EN IEC 60747-17:2020:2021 Edition
Semiconductor devices – Magnetic and capacitive coupler for basic and reinforced insulation Published By Publication…
-
BS EN IEC 60749-10:2022 – TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Mechanical shock. device and subassembly…
-
BSI PD CISPR/TR 16-4-1:2003:2008 Edition
Specification for radio disturbance and immunity measuring apparatus and methods – Uncertainties, statistics and limit…
-
BS EN 60747-16-3:2002+A2:2017:2018 Edition
Semiconductor devices – Microwave integrated circuits. Frequency converters Published By Publication Date Number of Pages…
-
BS EN 60749-30:2005+A1:2011
Semiconductor devices. Mechanical and climatic test methods – Preconditioning of non-hermetic surface mount devices prior…
-
BS EN 60749-37:2008
Semiconductor devices. Mechanical and climatic test methods – Board level drop test method using an…
-
BS EN IEC 60747-17:2020
Semiconductor devices – Magnetic and capacitive coupler for basic and reinforced insulation Published By Publication…
-
BS EN 60749-20:2009 2010
Semiconductor devices. Mechanical and climatic test methods – Resistance of plastic encapsulated SMDs to the…
-
BS IEC 60748-23-4:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification – Blank…
-
BS EN 60749-18:2003:2004 Edition
Semiconductor devices. Mechanical and climatic test methods – Ionizing radiation (total dose) Published By Publication…
-
BS EN IEC 60749-39:2022
Semiconductor devices. Mechanical and climatic test methods – Measurement of moisture diffusivity and water solubility…
-
BS EN 60749:1999:2002 Edition
Semiconductor devices. Mechanical and climatic test methods Published By Publication Date Number of Pages BSI…
-
BS EN 60749-5:2017 – TC:2020 Edition
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Steady-state temperature humidity bias life…
-
BS EN 60746-1:2003
Expression of performance of electrochemical analyzers – General Published By Publication Date Number of Pages…
-
BS IEC 60748-23-2:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification – Internal…
-
BS IEC 60747-7:2010+A1:2019
Semiconductor devices. Discrete devices – Bipolar transistors Published By Publication Date Number of Pages BSI…
-
BS EN 60749-17:2003:2004 Edition
Semiconductor devices. Mechanical and climatic test methods – Neutron irradiation Published By Publication Date Number…
-
BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods – Mechanical shock. device and subassembly Published By…
-
BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods – Board level drop test method using an…
-
BS IEC 61504:2017
Nuclear facilities. Instrumentation and control systems important to safety. Centralized systems for continuous monitoring of…
-
IEC 60748-23-1:2002
Semiconductor devices – Integrated circuits – Part 23-1: Hybrid integrated circuits and film structures –…
-
BS IEC 60748-23-1:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification – Generic…
-
BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods – Preconditioning of non-hermetic surface mount devices prior…
-
BS EN IEC 60747-17:2020:2021 Edition
Semiconductor devices – Magnetic and capacitive coupler for basic and reinforced insulation Published By Publication…
-
BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods – Preconditioning of non-hermetic surface mount devices prior…
-
BS IEC 60747-7:2010+A1:2019
Semiconductor devices. Discrete devices – Bipolar transistors Published By Publication Date Number of Pages BSI…
-
BS IEC 60748-23-5:2003 2004
Semiconductor devices. Integrated circuits – Hybrid integrated circuits and film structures. Manufacturing line certification. Procedure…
-
BS EN IEC 60749-20:2020
Semiconductor devices. Mechanical and climatic test methods – Resistance of plastic encapsulated SMDs to the…