IEEE 167A.1 1995

$40.63

IEEE Standard Facsimile Test Chart: Bi-level (Black & White)

Published By	Publication Date	Number of Pages
IEEE	1995	13

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Category: IEEE

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Description

Revision Standard – Inactive – Withdrawn. A facsimile test chart for assessing performance of document facsimile systems, including any compatible combination of facsimile equipment, computers, transmission facilities, and image storage, is provided. The chart is composed solely of high-resolution, high contrast black-and-white patterns. Although the chart is designed for Group 3 and Group 4 facsimile, it is also expected to be useful in testing other imaging systems. The received image may be recorded or displayed. This standard offers a means of assessing various technical quality parameters, detecting defects produced in received images, and evaluating the readability of text when the original is black and white.

PDF Catalog

PDF Pages	PDF Title
5	1 Overview 1.1 Scope 1.2 Purpose Test chart description Pattern 1-ITU-T border of 4 scales with inch and millimeter markings
7	Pattern 2-Black bar across full page width and a scale in inches across the top Pattern 3-Four patterns of truncated fan-type multiple-line pattern with low taper rate white lines per inch Pattern 5-Alternating black-and-white lines Pattern &Black-and-white bar patterns Pattern 7-Isolated black and white lines calibrated in micrometers Pattern 8-NIST type resolution pattern micrometers or inches Pattern 10-Black-white bar pattern of 5 black plus white bars per inch Pattern 1 1-Parallel lines inclined at 5 degrees from vertical Pattern 12-NIST type resolution pattern
8	Pattern 13-Diagonal line for checking irregularities in vertical pitch Pattern 15-Halftone dot screens of 10 50 and 90 percent black Pattern 16-Line crossing pattern Pattern 17-Text in English Arabic Chinese Russian Spanish and French
9	Annex A (informative) Guidelines for use
12	Annex B (informative) Bibligraphy