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IEEE 644-2019

$39.00

IEEE Standard Procedures for Measurement of Power Frequency Electric and Magnetic Fields from AC Power Lines

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IEEE 2019
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Revision Standard – Active. Uniform procedures for the measurement of power frequency electric and magnetic fields from alternating current (ac) overhead power lines and for the calibration of the meters used in these measurements are established in this standard. The procedures apply to the measurement of electric and magnetic fields close to ground level. The procedures can also be tentatively applied (with limitations, as specified in the standard) to electric fields near an energized conductor or structure.

PDF Catalog

PDF Pages PDF Title
1 IEEE Std 644™-2019 Front Cover
2 Title page
4 Important Notices and Disclaimers Concerning IEEE Standards Documents
8 Participants
10 Introduction
11 Contents
12 1. Overview
1.1 Scope
1.2 Purpose
1.3 Word usage
13 2. Definitions
17 3. Electric field strength meters
3.1 General characteristics
19 3.2 Theory and operational characteristics
20 3.3 Calibration of electric field strength meters
25 3.4 Immunity from interference
3.5 Parameters affecting accuracy of electric field strength measurements
27 4. Electric field strength measurement procedures
4.1 Procedure for measuring electric field strength near power lines
4.2 Lateral profile
28 4.3 Longitudinal profile
29 4.4 Precautions and checks during E-field measurements
30 4.5 Measurement uncertainty
5. Magnetic field meters
5.1 General characteristics of magnetic field meters
31 5.2 Theory and operational characteristics
32 5.3 Calibration of magnetic field meters
35 5.4 Immunity from interference
5.5 Parameters affecting accuracy of magnetic field measurements
36 6. Magnetic field measurement procedures
6.1 Procedure for measuring the magnetic field near power lines
6.2 Lateral profile
37 6.3 Longitudinal profile
6.4 Precautions and checks during magnetic field measurements(harmonic content
6.5 Measurement uncertainty
7. Reporting field measurements
38 Annex A (informative) Bibliography
40 Back Cover
IEEE 644-2019
$39.00