TIA-455-130:2001 (R2014)

$22.75

Elevated Temperature Life Test for Laser Diodes

Published By	Publication Date	Number of Pages
TIA	2001	18

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Category: TIA

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Description

Although the test is intended as a means to obtain a set of
parameters that describe the reliability of the device population,
the determination of an activation energy due to either temperature
or current density is beyond the scope of this FOTP. This test is
directed toward semiconductor laser diodes used in
telecommunication applications for transmission or pumping
purposes. Unless otherwise noted, this procedure applies to all
semiconductor laser diodes that can be operated in a CW mode of
operation; this includes pump lasers, direct and externally
modulated lasers for both digital and analog applications. Also,
this test is intended for sub-mounted (unpackaged) devices.