UNE-EN 60749-3:2017
$19.50
Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual examination
| Published By | Publication Date | Number of Pages |
| AENOR | 2017-07-01 | 21 |
| Published Code | AENOR |
|---|---|
| Published By | Asociación Española de Normalización |
| Publication Date | 2017-07-01 |
| Pages Count | 21 |
| Language | English |
| File Size | 2.1 MB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
