BS EN 61788-14:2010
$142.49
Superconductivity – Superconducting power devices. General requirements for characteristic tests of current leads designed for powering superconducting devices
Published By | Publication Date | Number of Pages |
BSI | 2010 | 32 |
IEC 61788-14:2010 provides general requirements for characteristic tests of conventional as well as superconducting current leads to be used for powering superconducting equipment. Current leads are indispensable components of superconducting devices in practical uses such as MRI diagnostic equipment, NMR spectrometers, single crystal growth devices, SMES, particle accelerators such as Tevatron, HERA, RHIC and LHC, experimental test instruments for nuclear fusion reactors, such as ToreSupra, TRIAM, LHD, EAST, KSTAR, W7-X, JT-60SA and ITER, etc., and of advanced superconducting devices in the near future in practical uses such as magnetic levitated trains, superconducting fault current limiters, superconducting transformers, etc. The major functions of current leads are to power high currents into superconducting devices and to minimize the overall heat load, including heat leakage from room temperature to cryogenic temperature and Joule heating through current leads. For this purpose, current leads are dramatically effective for lowering the overall heat load to use the high temperature superconducting component as a part of the current leads. Key words: superconductivity, TC90
PDF Catalog
PDF Pages | PDF Title |
---|---|
7 | CONTENTS |
8 | INTRODUCTION |
9 | 1 Scope 2 Normative references 3 Terms and definitions |
10 | 4 Principles |
11 | 5 Characteristic test items |
12 | 6 Characteristic test methods 6.1 Structure inspection Table 1 – Characteristic test items and test execution stages for current leads |
13 | 6.2 Stress/strain effect test 6.3 Thermal property test |
14 | 6.4 Rated current-carrying test |
15 | 6.5 Contact resistance test 6.6 Voltage drop test 6.7 High voltage test |
16 | 6.8 Pressure drop test 6.9 Leak tightness test |
17 | 6.10 Safety margin test |
18 | 7 Reporting 8 Precautions |
19 | Annex A (informative) Supplementary information relating to Clauses 1 to 8 |
21 | Annex B (informative) Typical current leads Figures Figure B.1 – Schematic diagram of self-cooled normal conducting current leads |
22 | Figure B.2 – Schematic diagram of forced flow cooled normal conducting current leads Figure B.3 – Schematic diagram of current leads composed of forced flow cooled normal conducting section and HTS section in vacuum environment |
23 | Figure B.4 – Schematic diagram of current leads composed of forced flow cooled normal conducting section and HTS section in GHe environment Figure B.5 – Schematic diagram of current leads composed of LN2/GN2/GHe cooled normal conducting section and self-sufficient evaporated helium cooled HTS section |
24 | Figure B.6 – Schematic diagram of current leads composed of conduction cooled normal conducting section and HTS section |
25 | Annex C (informative) Explanation figures to facilitate understanding of test methods Figure C.1 – Schematic drawing of a temperature profile during the rated current-carrying test Figure C.2 – Schematic drawing of a pressure dependency of the breakdown voltage in the Paschen tightness test |
26 | Figure C.3 – Schematic drawing of a time dependency of the voltage rise at the quench test |
27 | Annex D (informative) Test items and methods for a HTS component Table D.1 – Characteristic test items for a HTS component |
29 | Bibliography |