{"id":321117,"date":"2024-10-19T22:12:58","date_gmt":"2024-10-19T22:12:58","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-156252014\/"},"modified":"2024-10-25T20:37:25","modified_gmt":"2024-10-25T20:37:25","slug":"bs-iso-156252014","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-156252014\/","title":{"rendered":"BS ISO 15625:2014"},"content":{"rendered":"
This International Standard specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.<\/p>\n
This International Standard is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Section sec_1 Section sec_2 Section sec_3 Section sec_3.1 Section sec_3.2 Section sec_3.3 Section sec_3.4 Section sec_3.5 1\tScope 2\tNormative references 3\tTerms and definitions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Section sec_3.6 Section sec_3.7 Section sec_3.8 Section sec_3.9 Section sec_4 Section sec_5 Section sec_5.1 Section sec_5.2 Section sec_5.2.1 4\tPrinciple 5\tApparatus <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Section sec_5.2.2 Section sec_5.3 Section sec_5.4 Section sec_5.4.1 Section sec_5.4.2 Section sec_5.4.3 Section sec_6 Section sec_7 Section sec_7.1 Section sec_7.2 Section sec_7.2.1 Section sec_7.2.2 6\tAtmospheres for conditioning and testing 7\tLot formation and sampling 7.1\tLot formation 7.2\tSampling <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Section sec_8 Section sec_8.1 Section sec_8.1.1 Section sec_8.1.2 Section sec_8.1.3 Table tab_1 Section sec_8.2 Section sec_8.3 Section sec_8.3.1 Section sec_8.3.2 Section sec_8.4 Section sec_9 Section sec_9.1 8\tLaboratory sample preparation 8.1\tRaw silk in skein 8.2\tRaw silk on cone 8.3\tSoaked silk 8.4\tSampling length 9\tSetting 9.1\tSetting of the apparatus <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Section sec_9.1.1 Section sec_9.1.2 Section sec_9.1.3 Section sec_9.1.4 Section sec_9.2 Section sec_10 Section sec_10.1 Section sec_10.2 Section sec_10.3 Section sec_10.4 Section sec_10.5 Section sec_10.6 Section sec_10.7 Section sec_10.8 Section sec_11 Section sec_11.1 9.2\tSetting of the testing parameters of defects 10\tTest procedure 11\tCalculation and expression of test results <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | Section sec_11.2 Section sec_11.3 Section sec_11.4 Section sec_12 Section sec_13 12\tPrecision 13\tTest report <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | Annex sec_A Annex sec_A.1 Annex sec_A.1.1 Figure fig_A.1 Annex sec_A.1.2 Annex\u00a0A \n(normative)<\/p>\n Defect counting and classification <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Figure fig_A.2 Figure fig_A.3 Annex sec_A.1.3 <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Annex sec_B Annex sec_B.1 Annex sec_B.2 Annex sec_B.3 Annex\u00a0B \n(informative)<\/p>\n Difference between the optical and capacitive sensors in detecting defects of raw silk <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Annex sec_C Annex sec_C.1 Annex sec_C.1.1 Annex sec_C.1.2 Annex sec_C.2 Annex sec_C.2.1 Annex sec_C.2.2 Annex sec_C.2.3 Annex\u00a0C \n(normative)<\/p>\n Method for preparing soaked raw silk in lab <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Annex sec_C.3 Annex sec_C.4 Annex sec_C.4.1 Annex sec_C.4.2 Annex sec_C.4.3 <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Annex sec_D Table tab_D.1 Annex\u00a0D \n(informative)<\/p>\n An example of the electronic testing result sheet <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Annex sec_E Table tab_E.1 Annex\u00a0E \n(informative)<\/p>\n Testing precision <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Reference ref_1 Reference ref_2 Reference ref_3 Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Silk. Electronic test method for defects and evenness of raw silk<\/b><\/p>\n |