{"id":417175,"date":"2024-10-20T06:14:44","date_gmt":"2024-10-20T06:14:44","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-60747-101991-2\/"},"modified":"2024-10-26T11:36:54","modified_gmt":"2024-10-26T11:36:54","slug":"bs-iec-60747-101991-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-60747-101991-2\/","title":{"rendered":"BS IEC 60747-10:1991"},"content":{"rendered":"

This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ).<\/p>\n

This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.<\/p>\n

It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:<\/p>\n