{"id":483084,"date":"2024-11-05T11:59:25","date_gmt":"2024-11-05T11:59:25","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/une-en-iec-63287-12021\/"},"modified":"2024-11-05T11:59:25","modified_gmt":"2024-11-05T11:59:25","slug":"une-en-iec-63287-12021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/aenor\/une-en-iec-63287-12021\/","title":{"rendered":"UNE-EN IEC 63287-1:2021"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"
Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification<\/b><\/p>\n\n\n
\n Published By<\/td>\n Publication Date<\/td>\n Number of Pages<\/td>\n<\/tr>\n \n AENOR<\/b><\/a><\/td>\n 2021-11-01<\/td>\n 53<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":0,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[573,2700],"product_tag":[],"class_list":{"0":"post-483084","1":"product","2":"type-product","3":"status-publish","5":"product_cat-31-080-01","6":"product_cat-aenor","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/483084","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=483084"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=483084"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=483084"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}