ASTM-B878 1997

$35.75

B878-97 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

Published By	Publication Date	Number of Pages
ASTM	1997	11

Guaranteed Safe Checkout

Category: ASTM

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

ASTM B878-97

Historical Standard: Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

ASTM B878

Scope

1.1 This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum duration.

1.2 The minimum durations specified in this standard are 1, 10, and 50 nanoseconds (ns).

1.3 The minimum sample resistance required for an event detection in this standard is 10.

1.4 An ASTM guide for measuring electrical contact transients of various durations is available as Guide B 854.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

event detection; nanosecond events; nanosecond intermittences

ICS Code

ICS Number Code n/a

DOI: 10.1520/B0878-97

Additional information

Standard Title	B878-97 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Published Code	ASTM
Publication Date	1997
Pages Count	11