ASTM-E1078:2002 Edition

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E1078-02 Standard Guide for Specimen Preparation and Mounting in Surface Analysis

Published By	Publication Date	Number of Pages
ASTM	2002	9

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Categories: 71.040.50 - Physicochemical methods of analysis, ASTM

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Description

ASTM E1078-02

Historical Standard: Standard Guide for Specimen Preparation and Mounting in Surface Analysis

ASTM E1078

Scope

1.1 This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:

1.1.1 Auger electron spectroscopy (AES),

1.1.2 X-ray photoelectron spectroscopy (XPS and ESCA), and

1.1.3 Secondary ion mass spectrometry, (SIMS).

1.1.4 Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

auger electron spectroscopy; secondary ion mass spectroscopy; specimen mounting; specimen preparation; specimen treatment; surface analysis; x-ray photoelectron spectroscopy

ICS Code

ICS Number Code 71.040.50 (Physicochemical methods of analysis)

DOI: 10.1520/E1078-02

Additional information

Standard Title	E1078-02 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Published Code	ASTM
Publication Date	2002
Pages Count	9
ICS Codes	71.040.50 - Physicochemical methods of analysis