ASTM-E2444 2005

$35.75

E2444-05 Terminology Relating to Measurements Taken on Thin, Reflecting Films

Published By	Publication Date	Number of Pages
ASTM	2005	3

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Categories: 01.040.31 - Electronics (Vocabularies), ASTM

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Description

ASTM E2444-05

Historical Standard: Terminology Relating to Measurements Taken on Thin, Reflecting Films

ASTM E2444

Scope

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

Keywords

ICS Code

ICS Number Code 01.040.31 (Electronics (Vocabularies))

DOI:

PDF Catalog

PDF Pages	PDF Title
1	Scope Referenced Documents Terminology
2	FIG. 1 FIG. 2
3	Keywords FIG. 3

Additional information

Standard Title	E2444-05 Terminology Relating to Measurements Taken on Thin, Reflecting Films
Published Code	ASTM
Publication Date	2005
Pages Count	3
ICS Codes	01.040.31 - Electronics (Vocabularies)