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ASTM-F1191:1988 Edition

$40.63

F1191-88 Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)

Published By Publication Date Number of Pages
ASTM 1988 7
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ASTM F1191-88

Withdrawn Standard: Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)

ASTM F1191

Scope

Keywords

ICS Code

ICS Number Code 31.080.01 (Semi-conductor devices in general)

DOI:

ASTM-F1191
$40.63