Name: BS EN 60749-16:2003 PDF - PDF Standards Store
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BS EN 60749-16:2003:2004 Edition

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Semiconductor devices. Mechanical and climatic test methods – Particle impact noise detection (PIND)

Published By	Publication Date	Number of Pages
BSI	2004	10

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Status	Definitive
Pages	10
Publication Date	2004-06-24
ISBN	0 580 42062 0
Standard Number	BS EN 60749-16:2003
Title	Semiconductor devices. Mechanical and climatic test methods – Particle impact noise detection (PIND)
Identical National Standard Of	EN 60749-16:2003, IEC 60749-16:2003
Corrects	BS EN 60749-16:2003
Descriptors	Climate, Electronic equipment and components, Environmental testing, Acoustic measurement, Mechanical testing, Holes, Solders, Semiconductor devices, Wires, Non-destructive testing, Noise (spurious signals), Vibration testing, Particulate materials, Integrated circuits, Ceramics
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.01 - Semiconductor devices in general


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