BS EN 60749-6:2002

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Semiconductor devices. Mechanical and climatic test methods – Storage at high temperature

Published By	Publication Date	Number of Pages
BSI	2002	8

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Additional information

Status	Withdrawn
Partially Replaces	BS EN 60749:1999
Title	Semiconductor devices. Mechanical and climatic test methods – Storage at high temperature
Publisher	BSI
Committee	EPL/47
Pages	8
Publication Date	2002-09-10
Withdrawn Date	2017-11-24
Replaced By	BS EN 60749-6:2017
ISBN	0 580 40334 3
Standard Number	BS EN 60749-6:2002
Identical National Standard Of	IEC 60749-6:2002, EN 60749-6:2002
Descriptors	Integrated circuits, Semiconductor devices, Semiconductor storage, Mechanical testing, Climate, Electronic equipment and components, Electronic storage, Environmental testing, High temperatures
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-6:2002

$86.31


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