🔥🔥 Don’t Miss Out on Our End of Autumn Sale. If you have any questions, feel free to click the bottom right corner to contact our customer service..

Concat us[email protected]
Shopping Cart

No products in the cart.

🔍
BS EN 60749-7:2011

BS EN 60749-7:2011

$102.76

Semiconductor devices. Mechanical and climatic test methods – Internal moisture content measurement and the analysis of other residual gases

Published By Publication Date Number of Pages
BSI 2011 16
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Categories: ,

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.

PDF Catalog

PDF Pages PDF Title
5 English

CONTENTS
6 FOREWORD
8 1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
4.1 Mass spectrometer method
4.2 Mass spectrometer
10 4.3 Vacuum opening chamber
4.4 Piercing arrangement
4.5 Pressure-sensing device
11 5 Procedure
12 6 Failure criteria
7 Implementation
13 8 Summary
14 Bibliography

Related products

BS EN 60749-7:2011
$102.76