BS EN 61000-4-15:2011:2012 Edition
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Electromagnetic compatibility (EMC) – Testing and measurement techniques. Flickermeter. Functional and design specifications
Published By | Publication Date | Number of Pages |
BSI | 2012 | 44 |
This part of IEC 61000 gives a functional and design specification for flicker measuring apparatus intended to indicate the correct flicker perception level for all practical voltage fluctuation waveforms. Information is presented to enable such an instrument to be constructed. A method is given for the evaluation of flicker severity on the basis of the output of flickermeters complying with this standard.
The flickermeter specifications in this part of IEC 61000 relate only to measurements of 120 V and 230 V, 50 Hz and 60 Hz inputs. Characteristics of some incandescent lamps for other voltages are sufficiently similar to the values in Table 1 and Table 2, that the use of a correction factor can be applied for those other voltages. Some of these correction factors are provided in the Annex B. Detailed specifications for voltages and frequencies other than those given above, remain under consideration.
The object of this part of IEC 61000 is to provide basic information for the design and the instrumentation of an analogue or digital flicker measuring apparatus. It does not give tolerance limit values of flicker severity.
PDF Catalog
PDF Pages | PDF Title |
---|---|
6 | English CONTENTS |
8 | INTRODUCTION |
9 | 1 Scope and object 2 Normative references |
10 | 3 Parameters and symbols 3.1 Directly measured parameters and characteristics |
12 | 3.2 Symbols |
13 | 4 Description of the instrument 4.1 General 4.2 Block 1 – Input voltage adaptor 4.3 Block 2 – Squaring multiplier |
14 | 4.4 Block 3 – Weighting filters 4.5 Block 4 – Squaring and smoothing 4.6 Block 5 – On-line statistical analysis |
15 | 4.7 Outputs 5 Specification 5.1 Response and accuracy |
16 | Tables Table 1a – Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz for sinusoidal voltage fluctuations |
17 | Table 1b – Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for sinusoidal voltage fluctuations |
18 | Table 2a – Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz for rectangular voltage fluctuations |
19 | Table 2b – Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for rectangular voltage fluctuations |
20 | 5.2 Input voltage ranges 5.3 Voltage adaptor 5.4 Weighting filters 5.5 Weighting filter response in block 3 |
22 | 6 Flickermeter tests 6.1 General |
23 | 6.2 Sinusoidal/rectangular voltage changes 6.3 Rectangular voltage changes and performance testing Table 4 – Test specifications for flickermeter |
24 | 6.4 Combined frequency and voltage changes – Class F1 flickermeters Table 5 – Test specification for flickermeter classifier |
25 | 6.5 Distorted voltage with multiple zero crossings – Class F1 flickermeters 6.6 Bandwidth test using harmonic and inter-harmonic side band modulation Table 6 – Test specification for combined frequency and voltage changes – Class F1 flickermeters Table 7 – Test specification for distorted voltage with multiple zero crossings – Class F1 flickermeters Table 8 – 8,8 Hz modulation depth for distorted voltage test – Class F 1 flickermeters |
26 | 6.7 Phase jumps – Class F1 flickermeters 6.8 Rectangular voltage changes with 20 % duty cycle Table 9 – Test specification for Harmonics with side band – Class F1 flickermeters Table 10 – Test specification for phase jumps – Class F1 flickermeters Table 11 – Test specification for rectangular voltage changes with duty ratio |
27 | 6.9 d parameter test, dc, dmax, and d(t) > 3,3% Figures Figure 1 – Illustration of 28 Hz modulated test voltage with 20 % duty cycle Table 12 – Test specification for dc, dmax, t(d(t)) > 3,3 % |
28 | Table 13 – Test specification for dc, dmax, t(d(t)) > 3,3 % |
29 | 7 Environmental and other requirements 7.1 General 7.2 Insulation, climatic, electromagnetic compatibility, and other tests |
30 | Figure 2 – Functional diagram of IEC flickermeter |
31 | Figure 3 – Basic illustration of the time-at-level method for Pst = 2,000 |
32 | Annex A (normative) Techniques to improve accuracy of flicker evaluation |
34 | Annex B (informative) Meaning of ΔU/U and number of voltage changes, dc, d(t), dmax examples |
35 | Figure B.1 – Rectangular voltage change ΔU/U = 40 %, 8,8 Hz, 17,6 changes/second Table B.1 – Correction factor for other voltage/frequency combinations |
37 | Figure B.2 – Illustration of “d” parameter definitions |
38 | Annex C (informative) Sample protocols for type testing |
42 | Bibliography |