๐Ÿ”ฅ๐Ÿ”ฅ Donโ€™t Miss Out on Our End of Autumn Sale. If you have any questions, feel free to click the bottom right corner to contact our customer service..

Concat us[email protected]
Shopping Cart

No products in the cart.

๐Ÿ”
BS EN 62433-4:2016

BS EN 62433-4:2016

$215.11

EMC IC modelling – Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)

Published By Publication Date Number of Pages
BSI 2016 112
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Category:

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. Weโ€™re here to assist you 24/7.
Email:[email protected]

IEC 62433-4:2016 specifies a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC). This model is commonly called Integrated Circuit Immunity Model – Conducted Immunity, ICIM-CI. It is intended to be used for predicting the levels of immunity to conducted RF disturbances applied on IC pins. In order to evaluate the immunity threshold of an electronic device, this macro-model will be inserted in an electrical circuit simulation tool. This macro-model can be used to model both analogue and digital ICs (input/output, digital core and supply). This macro-model does not take into account the non-linear effects of the IC. The added value of ICIM-CI is that it could also be used for immunity prediction at board and system level through simulations. This part of IEC 62433 has two main parts: – the electrical description of ICIM-CI macro-model elements; – a universal data exchange format called CIML based on XML. This format allows ICIM-CI to be encoded in a more useable and generic form for immunity simulation.

PDF Catalog

PDF Pages PDF Title
6 English
CONTENTS
11 FOREWORD
13 1 Scope
2 Normative references
14 3 Terms, definitions, abbreviations and conventions
3.1 Terms and definitions
15 3.2 Abbreviations
3.3 Conventions
16 4 Philosophy
5 ICIM-CI model description
5.1 General
17 Figures
Figure 1 โ€“ Example of ICIM-CI model structure
18 5.2 PDN description
Figure 2 โ€“ Example of an ICIM-CI model of an electronic board
19 5.3 IBC description
20 5.4 IB description
Figure 3 โ€“ Example of an IBC network
Figure 4 โ€“ ICIM-CI model representation with different blocks
21 6 CIML format
6.1 General
22 6.2 CIML structure
Figure 5 โ€“ CIML inheritance hierarchy
23 6.3 Global keywords
6.4 Header section
24 6.5 Lead definitions
Tables
Table 1 โ€“ Attributes of Lead keyword in the Lead_definitions section
Table 2 โ€“ Compatibility between the Mode and Type fields for correct CIML annotation
25 6.6 SPICE macro-models
Table 3 โ€“ Subckt definition
26 Figure 6 โ€“ Example of a netlist file defining a sub-circuit
27 6.7 Validity section
6.7.1 General
6.7.2 Attribute definitions
Table 4 โ€“ Definition of the Validity section
29 6.8 PDN
6.8.1 General
Table 5 โ€“ Definition of the Lead keyword for Pdn section
30 6.8.2 Attribute definitions
32 Table 6 โ€“ Valid data formats and their default units in the Pdn section
Table 7 โ€“ Valid file extensions in the Pdn section
33 6.8.3 PDN for a single-ended input or output
Figure 7 โ€“ PDN electrical schematics
Figure 8 โ€“ PDN represented as a one-port black-box
34 Table 8 โ€“ Valid fields of the Lead keyword for single-ended PDN
36 Figure 9 โ€“ PDN represented as S-parameters in Touchstone format
37 Figure 10 โ€“ PDN represented as two-port S-parameters in Touchstone format
38 Figure 11 โ€“ Example structure for defining the PDN using circuit elements
Table 9 โ€“ Netlist definition
39 Figure 12 โ€“ Example of a single-ended PDN Netlist main circuit definition
Figure 13 โ€“ Example of a single-ended PDN Netlist with both sub-circuit and main circuit definitions
40 6.8.4 PDN for a differential input
41 Figure 14 โ€“ Differential input schematic
Figure 15 โ€“ PDN represented as a two-port black-box
Figure 16 โ€“ PDN data format for differential input or output
42 Table 10 โ€“ Valid fields of the Lead keyword for differential PDN
43 6.8.5 PDN multi-port description
Figure 17 โ€“ Differential inputs of an operational amplifier example
44 6.9 IBC
6.9.1 General
Figure 18 โ€“ ICIM-CI Model for a 74HC08 component
45 6.9.2 Attribute definitions
Table 11 โ€“ Differences between the Pdn and Ibc section fields
46 6.10 IB
6.10.1 General
Table 12 โ€“ Valid fields of the Lead keyword for IBC definition
47 6.10.2 Attribute definitions
Table 13 โ€“ Definition of the Lead keyword in Ib section
48 Table 14 โ€“ Max_power_level definition
49 Table 15 โ€“ Voltage, Current and Power definition
Table 16 โ€“ Test_criteria definition
52 6.10.3 Description
Table 17 โ€“ Default values of Unit_voltage, Unit_current and Unit_power tags as a function of data format
Table 18 โ€“ Valid file extensions in the Ib section
54 7 Extraction
7.1 General
7.2 Environmental extraction constraints
Figure 19 โ€“ Example IB file obtained from DPI measurement
55 7.3 PDN extraction
7.3.1 General
7.3.2 S-/Z-/Y-parameter measurement
7.3.3 RFIP technique
56 7.4 IB extraction
7.4.1 General
7.4.2 Direct RF power injection test method
Figure 20 โ€“ Test setup of the DPI immunity measurement method as specified in IECย 62132-4
57 Figure 21 โ€“ Principle of single and multi-pin DPI
58 7.4.3 RF Injection probe test method
Figure 22 โ€“ Electrical representation of the DPI test setup
59 Figure 23 โ€“ Test setup of the RFIP measurement method derived from the DPI method
60 7.5 IBC
8 Validation of ICIM-CI hypotheses
8.1 General
Table 19 โ€“ Example of IB table pass/fail criteria
61 8.2 Linearity
Figure 24 โ€“ Example setup used for illustrating ICIM-CI hypotheses
62 8.3 Immunity criteria versus transmitted power
Figure 25 โ€“ Example of linearity assumption validation
63 9 Model usage
Figure 26 โ€“ Example of transmitted power criterion validation
Figure 27 โ€“ Use of the ICIM-CI macro-model for simulation
65 Annexes
Annex A (normative) Preliminary definitions for XML representation
A.1 XML basics
A.1.1 XML declaration
A.1.2 Basic elements
A.1.3 Root element
66 A.1.4 Comments
A.1.5 Line terminations
A.1.6 Element hierarchy
A.1.7 Element attributes
A.2 Keyword requirements
A.2.1 General
67 A.2.2 Keyword characters
A.2.3 Keyword syntax
A.2.4 File structure
68 Figure A.1 โ€“ Multiple XML (CIML) files
Figure A.2 โ€“ XML files with data files (*.dat)
69 A.2.5 Values
Figure A.3 โ€“ XML files with additional files
70 Table A.1 โ€“ Valid logarithmic units
72 Annex B (informative) ICIM-CI example with disturbance load
Figure B.1 โ€“ ICIM-CI description applied to an oscillator stage for extracting IB
73 Annexย C (informative) Conversions between parameter types
C.1 General
C.2 Single-ended input or output
Figure C.1 โ€“ Single-ended DI
74 C.3 Differential input or output
Figure C.2 โ€“ Differential DI
Figure C.3 โ€“ Two-port representation of a differential DI
Table C.1 โ€“ Single-ended parameter conversion
75 Table C.2 โ€“ Differential parameter conversion
76 Figureย C.4 โ€“ Simulation of common-mode injection on a differential DI based on DPI
Figure C.5 โ€“ Equivalent common-mode input impedance of a differential DI
Figure C.6 โ€“ Determination of transmitted power for a differential DI
77 Table C.3 โ€“ Power calculation
78 Annex D (informative) Example of ICIM-CI macro-model in CIML format
Figure D.1 โ€“ Test setup on an example LIN transceiver
80 Figure D.2 โ€“ PDN data in touchstone format (s2p), data measured using VNA
81 Figure D.3 โ€“ PDN data of leads 6 (LIN) and 7 (VCC)
Figure D.4 โ€“ IB data in ASCII format (.txt), data measured using DPI method โ€“ Injection on VCC pin
82 Figure D.5 โ€“ IB data for injection on VCC pin
83 Annex E (normative) CIML Valid keywords and usage
E.1 Root element keywords
E.2 File header keywords
Table E.1 โ€“ Root element keywords
84 Table E.2 โ€“ Header section keywords
85 E.3 Validity section keywords
E.4 Global keywords
Table E.3 โ€“ Validity section keywords
86 E.5 Lead keyword
E.6 Lead_definitions section attributes
Table E.4 โ€“ Global keywords
Table E.5 โ€“ Lead element definition
87 E.7 Macromodels section attributes
Table E.6 โ€“ Lead_definitions section keywords
Table E.7 โ€“ Macromodels section keywords
88 E.8 Pdn section keywords
E.8.1 Lead element keywords
Table E.8 โ€“ Lead element keywords in the Pdn section
90 E.8.2 Netlist section keywords
91 E.9 Ibc section keywords
E.9.1 Lead element keywords
Table E.9 โ€“ Netlist section keywords
Table E.10 โ€“ Lead element keywords in the Ibc section
93 E.9.2 Netlist section keywords
E.10 Ib section keywords
E.10.1 Lead element keywords
94 Table E.11 โ€“ Lead element keywords in the Ib section
95 E.10.2 Max_power_level section keywords
E.10.3 Voltage section keywords
Table E.12 โ€“ Max_power_level section keywords
96 Table E.13 โ€“ Voltage section keywords
97 E.10.4 Current section keywords
Table E.14 โ€“ Current section keywords
98 E.10.5 Power section keywords
Table E.15 โ€“ Power section keywords
99 E.10.6 Test_criteria section keywords
100 Table E.16 โ€“ Test_criteria section keywords
101 Annex F (informative) PDN impedance measurement methods using vector network analyzer
F.1 General
F.2 Conventional one-port method
F.3 Two-port method for low impedance measurement
Figure F.1 โ€“ Conventional one-port S-parameter measurement
102 F.4 Two-port method for high impedance measurement
Figure F.2 โ€“ Two-port method for low impedance measurement
Figure F.3 โ€“ Two-port method for high impedance measurement
103 Annex G (informative) RFIP measurement method description
G.1 General
G.2 Obtaining immunity parameters
Figure G.1 โ€“ Test setup of the RFIP measurement method derived from DPI method
Figure G.2 โ€“ Principle of the RFIP measurement method
105 Annex H (informative) Immunity simulation with ICIM model based on pass/fail test
H.1 ICIM-CI macro-model of a voltage regulator IC
H.1.1 General
H.1.2 PDN extraction
H.1.3 IB extraction
Figure H.1 โ€“ Electrical schematic for extracting the voltage regulatorโ€™s ICIM-CI
106 H.1.4 SPICE-compatible macro-model
H.2 Application level simulation and failure prediction
Figure H.2 โ€“ ICIM-CI extraction on the voltage regulator example
Figure H.3 โ€“ Example of a SPICE-compatible ICIM-CI macro-model of the voltage regulator
107 Figure H.4 โ€“ Example of a board level simulation on the voltage regulatorโ€™s ICIM-CI with PCB model and other components including parasitic elements
Figure H.5 โ€“ Incident power as a function of frequency that is required to create a defect with a 10 nF filter
108 Annex I (informative) Immunity simulation with ICIM model based on non pass/fail test
Figure I.1 โ€“ Example of an IB file for a given failure criterion
109 Figure I.2 โ€“ Comparison of simulated transmitted power and measured immunity behaviour
110 Bibliography
BS EN 62433-4:2016
$215.11