BS EN IEC 60749-13:2018
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Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 20 |
This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 6 | English CONTENTS |
| 7 | FOREWORD |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions 4 Test apparatus |
| 10 | 5 Procedure 5.1 Conditioning and maintenance of test chamber 5.2 Initial preconditioning of leads 5.3 Mounting of test specimens |
| 11 | Figures Figure 1 – Dual-in-line packages with leads attached to, or exiting from package sides(such as side-brazed packages and ceramic dual-in-line packages) |
| 13 | Figure 2 – Packages with leads attached to, or exiting from the opposite side of the lid Figure 3 – Packages with leads attached to, or exiting from package sides,parallel to lids (such as flatpacks) |
| 14 | 5.4 Chamber operation 5.5 Length of test Figure 4 – Leadless and leaded chip carriers |
| 15 | 5.6 Examination 5.7 Failure criteria 5.7.1 Finished product Table 1 – Minimum duration of exposure |
| 16 | 5.7.2 Package elements 6 Summary |
| 17 | Figure 5 – Corrosion area charts |
| 18 | Bibliography |
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BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere Published By Publication Date Number…
