BS EN IEC 61189-2-805:2024
$86.31
Test methods for electrical materials, printed boards and other interconnection structures and assemblies – X/Y CTE test for thin base materials by TMA
Published By | Publication Date | Number of Pages |
BSI | 2024 | 14 |
This part of IEC 61189 defines the method to be followed for the determination of the X/Y coefficient of thermal expansion of thin electrical insulating materials via the use of a thermomechanical analyser (TMA). This method is applicable to materials that are solid for the entire range of temperature used, and that retain sufficient rigidity over the temperature range so that so that irreversible indentation of the specimen by the sensing probe does not occur.
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
4 | European foreword Endorsement notice |
5 | English CONTENTS |
6 | FOREWORD |
8 | 1 Scope 2 Normative references 3 Terms and definitions 4 Test specimens 4.1 Preparation 4.2 Number 4.3 Form |
9 | 4.4 Conditioning 5 Apparatus and materials 6 Procedure Figure 1 – TMA expansion curves: first heat cycles and second heat cycles |
10 | 7 Evaluation 7.1 General Figure 2 – TMA expansion curve |
11 | 7.2 Calculation of coefficient of thermal expansion curve Figure 3 – TMA expansion curve and instantaneous CTE curve |
12 | 7.3 Calculation of instantaneous coefficient of thermal expansion curve (optional) 8 Report |
13 | Bibliography |