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BS EN IEC 61189-2-805:2024

$86.31

Test methods for electrical materials, printed boards and other interconnection structures and assemblies – X/Y CTE test for thin base materials by TMA

Published By Publication Date Number of Pages
BSI 2024 14
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This part of IEC 61189 defines the method to be followed for the determination of the X/Y coefficient of thermal expansion of thin electrical insulating materials via the use of a thermomechanical analyser (TMA). This method is applicable to materials that are solid for the entire range of temperature used, and that retain sufficient rigidity over the temperature range so that so that irreversible indentation of the specimen by the sensing probe does not occur.

PDF Catalog

PDF Pages PDF Title
2 undefined
4 European foreword
Endorsement notice
5 English
CONTENTS
6 FOREWORD
8 1 Scope
2 Normative references
3 Terms and definitions
4 Test specimens
4.1 Preparation
4.2 Number
4.3 Form
9 4.4 Conditioning
5 Apparatus and materials
6 Procedure
Figure 1 – TMA expansion curves: first heat cycles and second heat cycles
10 7 Evaluation
7.1 General
Figure 2 – TMA expansion curve
11 7.2 Calculation of coefficient of thermal expansion curve
Figure 3 – TMA expansion curve and instantaneous CTE curve
12 7.3 Calculation of instantaneous coefficient of thermal expansion curve (optional)
8 Report
13 Bibliography
BS EN IEC 61189-2-805:2024
$86.31