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BS EN IEC 61280-4-1:2019+A1:2022:2023 Edition

BS EN IEC 61280-4-1:2019+A1:2022:2023 Edition

$215.11

Fibre-optic communication subsystem test procedures – Installed cabling plant. Multimode attenuation measurement

Published By Publication Date Number of Pages
BSI 2023 84
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PDF Catalog

PDF Pages PDF Title
2 undefined
7 English
CONTENTS
12 FOREWORD
14 1 Scope
2 Normative references
3 Terms, definitions, graphical symbols and abbreviated terms
15 3.1 Terms and definitions
17 3.2 Graphical symbols
18 Figures
Figure 1 – Connector symbols
Figure 2 – Symbol for cabling under test
19 3.3 Abbreviated terms
4 Test methods
4.1 General
20 4.2 Cabling configurations and applicable test methods
Tables
Table 1 – Cabling configurations
Table 2 – Test methods and configurations
21 Figure 3 – Reference plane for configuration A tested with the 1-cord method
Figure 4 – Reference plane for configuration B tested with the 3-cord method
22 5 Overview of uncertainties
5.1 General
5.2 Sources of significant uncertainties
Figure 5 – Reference plane for configuration C tested with the 2-cord method
Figure 6 – Reference plane for configuration D tested with the EC method
23 5.3 Consideration of the PM
5.4 Consideration of test cord connector grade
5.5 Typical uncertainty values
Table 3 – Measurements bias related to test cord connector grade
24 6 Apparatus
6.1 General
6.2 Light source
6.2.1 Stability
6.2.2 Spectral characteristics (LSPM measurement)
Table 4 – Uncertainty for a given attenuation at 850 nm
Table 5 – Spectral requirements
25 6.3 Launch cord
6.4 Receive or tail cord
26 6.5 Substitution cord
6.6 Power meter – LSPM methods only
6.7 OTDR apparatus
Figure 7 – OTDR schematic
27 6.8 Connector end face cleaning and inspection equipment
6.9 Adapters
7 Procedures
7.1 General
7.2 Common procedures
7.2.1 Care of the test cords
7.2.2 Make reference measurements (LSPM methods only)
7.2.3 Inspect and clean the ends of the optical fibres in the cabling
28 7.2.4 Make the measurements
7.2.5 Make the calculations
7.2.6 Duplex and bi-directional testing
7.3 Calibration
7.4 Safety
8 Calculations
9 Documentation
9.1 Information for each test
29 9.2 Information to be available
30 Annexes
Annex A (normative) One-cord method
A.1 Applicability of test method
A.2 Apparatus
A.3 Procedure
31 A.4 Calculation
A.5 Components of reported attenuation
Figure A.1 – Reference measurement
Figure A.2 – Test measurement
32 Annex B (normative) Three-cord method
B.1 Applicability of test method
B.2 Apparatus
B.3 Procedure
Figure B.1 – Reference measurement
33 B.4 Calculations
B.5 Components of reported attenuation
Figure B.2 – Test measurement
34 Annex C (normative) Two-cord method
C.1 Applicability of test method
C.2 Apparatus
C.3 Procedure
Figure C.1 – Reference measurement
35 C.4 Calculations
C.5 Components of reported attenuation
Figure C.2 – Test measurement
Figure C.3 – Test measurement for plug-socket style connectors
37 Annex D (normative) Equipment cord method
D.1 Applicability of the test method
D.2 Apparatus
D.3 Procedure
38 D.4 Calculation
D.5 Components of reported attenuation
Figure D.1 – Reference measurement
Figure D.2 – Test measurement
39 D.6 Typical uncertainty values
Table D.1 – Uncertainty for a given attenuation at 850 nm
40 Annex E (normative) Optical time domain reflectometer
E.1 Applicability of the test method
E.2 Apparatus
E.2.1 General
E.2.2 OTDR
E.2.3 Test cords
41 E.3 Procedure (test method)
Figure E.1 – OTDR method
42 E.4 Calculation
E.4.1 General
E.4.2 Connection location
Figure E.2 – Location of the ports of the cabling under test
43 E.4.3 Definition of power levels F1 and F2
E.4.4 Alternative calculation
Figure E.3 – Graphic construction of F1 and F2
45 E.5 OTDR uncertainties
Figure E.4 – Graphic construction of F1, F11, F12 and F2
47 Annex F (normative) Requirements for the source characteristics
F.1 Encircled flux
F.2 Assumptions and limitations
F.3 Encircled flux templates
F.3.1 General
48 F.3.2 Uncertainties expectations
F.3.3 Templates
Table F.1 – Attenuation, threshold tolerance and confidence level
Table F.2 – EF requirements for 50 µm core optical fibre cabling at 850 nm
49 F.4 Graphical representation of templates
Table F.3 – EF requirements for 50 μm core optical fibre cabling at 1 300 nm
Table F.4 – EF requirements for 62,5 μm core optical fibre cabling at 850 nm
Table F.5 – EF requirements for 62,5 μm core optical fibre cabling at 1 300 nm
50 Figure F.1 – Encircled flux example
51 Annex G (informative) OTDR configuration information
G.1 General
52 G.2 Fundamental parameters that define the operational capability of an OTDR
G.2.1 Dynamic range
G.2.2 Pulse width
G.2.3 Averaging time
G.2.4 Dead zone
G.3 Other parameters
G.3.1 Index of refraction
53 G.3.2 Measurement range
G.3.3 Distance sampling
G.4 Other measurement configurations
G.4.1 General
G.4.2 Macrobend or splice attenuation measurement
Table G.1 – Default effective group index of refraction values
54 G.4.3 Splice attenuation measurement
G.4.4 Measurement with high reflection connectors or short length cabling
Figure G.1 – Splice and macrobend attenuation measurement
55 Figure G.2 – Attenuation measurement with high reflection connectors
56 G.4.5 Ghost
Figure G.3 – Attenuation measurement of a short length cabling
57 G.5 More on the measurement method
Figure G.4 – OTDR trace with ghost
58 G.6 Bi-directional measurement
Figure G.5 – Cursor positioning
59 G.7 Non-recommended practices
G.7.1 Measurement without tail test cord
G.7.2 Cursor measurement
60 Annex H (informative) Test cord attenuation verification
H.1 General
H.2 Apparatus
H.3 Procedure
H.3.1 General
61 H.3.2 Test cord verification for the one-cord and two-cord methods when using non-pinned/unpinned and non-plug/socket style connectors
62 H.3.3 Test cord verification for the one-cord and two-cord methods when using pinned/unpinned or plug/socket style connectors
Figure H.1 – Obtaining reference power level P0
Figure H.2 – Obtaining power level P1
63 Figure H.3 – Obtaining reference power level P0
Figure H.4 – Obtaining power level P1
64 H.3.4 Test cord verification for the three-cord method when using non-pinned/unpinned and non-plug/socket style connectors
Figure H.5 – Obtaining reference power level P0
Figure H.6 – Obtaining power level
65 Figure H.7 – Obtaining reference power level P0
Figure H.8 – Obtaining power level P1
66 H.3.5 Test cord verification for the three-cord method when using pinned/unpinned or plug/socket style connectors
Figure H.9 – Obtaining power level P5
67 Figure H.10 – Obtaining reference power level P0
Figure H.11 – Obtaining power level P1
68 Annex I (normative) On the use of reference-grade test cords
I.1 General
I.2 Practical configurations and assumptions
I.2.1 Component specifications
69 I.2.2 Conventions
I.2.3 Reference planes
I.3 Impact of using reference grade test cords for recommended LSPM methods
70 I.4 Examples for LSPM measurements
I.4.1 Example 1 (configuration A, 1-C method – Annex A)
I.4.2 Example 2 (configuration D, EC method – Annex D)
Table I.1 – Measurement bias when using reference-grade test cords
71 I.5 Impact of using reference-grade test cords for different configurations using the OTDR test method
I.5.1 Cabling configurations A, B and C
Figure I.1 – Cabling configurations A, B and C tested with the OTDR method
72 I.5.2 Cabling configuration D
Table I.2 – Measurement bias when using reference grade test cords – OTDR test method
73 Figure I.2 – Cabling configuration D tested with the OTDR method
74 Annex J (informative) Launch cord output near-field verification
J.1 Direct verification
J.2 Test equipment manufacturer verification
J.3 Field check with physical artefact
J.3.1 General
75 Figure J.1 – Initial power measurement
Figure J.2 – Verification of reference-grade connection
Figure J.3 – Two offset splices
76 J.3.2 Procedure for attenuation characterization of artefacts
J.3.3 Construction details
Figure J.4 – Five offset splices
77 J.3.4 Example results
Figure J.5 – EF centred
78 Figure J.6 – EF underfilling
Figure J.7 – EF overfilling
79 Figure J.8 – L1 attenuation with mandrel
Figure J.9 – L1 attenuation with mandrel and mode conditioner
Figure J.10 – L2 attenuation with mandrel
80 Figure J.11 – L2 attenuation with mandrel and mode conditioning
Figure J.12 – L3 attenuation with mandrel
Figure J.13 – L3 attenuation with mandrel and mode conditioning
81 Bibliography

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