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BS EN IEC 63185:2021

BS EN IEC 63185:2021

$102.76

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method

Published By Publication Date Number of Pages
BSI 2021 20
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IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.

PDF Catalog

PDF Pages PDF Title
2 undefined
5 Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
7 English
CONTENTS
8 FOREWORD
10 1 Scope
2 Normative references
11 4 Measurement parameters
5 Theory and calculation equations
12 Figures
Figure 1 ā€“ Structure of a circular disk resonator
13 6 Measurement system
Figure 2 ā€“ Relations between resonant frequency and relative permittivity
14 7 Measurement procedure
7.1 Preparation of measurement apparatus
7.2 Adjustment of measurement conditions
7.3 Calibration of a vector network analyzer
Figure 3 ā€“ Schematic diagram of a vector network analyzer measurement system
15 7.4 Measurement of complex permittivity of test sample
7.5 Periodic checkup of metal in resonator
Figure 4 ā€“ Frequency response of |S21| of balanced-type circular disk resonator
16 Annex A (informative)Example of measurement results and associateduncertainties for complex permittivity
Tables
Table A.1 ā€“ Parameters of the cavity and the sheet sample
Table A.2 ā€“ The resonant frequencies and unloaded Q-factors
17 Table A.3 ā€“ Measurement results of complex permittivity
18 Bibliography

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BS EN IEC 63185:2021
$102.76