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BS EN IEC 63364-1:2022:2023 Edition

BS EN IEC 63364-1:2022:2023 Edition

$102.76

Semiconductor devices. Semiconductor devices for IoT system – Test method of sound variation detection

Published By Publication Date Number of Pages
BSI 2023 18
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This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.

PDF Catalog

PDF Pages PDF Title
2 undefined
4 European foreword
Endorsement notice
6 Blank Page
7 English
CONTENTS
8 FOREWORD
10 1 Scope
2 Normative references
3 Terms and definitions
11 4 Evaluation method and test setup
4.1 General
Figures
Figure 1 – Sound field space with boundary conditions and governing equation
12 4.2 Equipment and tools
4.3 Block diagram and semiconductor components
4.3.1 General
Figure 2 – Variation of transfer function due to obstacles in security area
13 4.3.2 Microphone sensor
4.3.3 Speaker
4.3.4 Micro controller
4.3.5 Transmitting module
4.4 Test methods
4.4.1 Cubic box
Figure 3 – Block diagram of the sound variation detectionsystem for IoT-based event detection
14 Figure 4 – Cubic box for experiment for sound field variation detection system
Figure 5 – Inner configuration within a cubic box
15 4.4.2 Measurement and data analysis
Figure 6 – Experimental SPL spectra in the 3 744 Hz –4 256 Hz range with 4 Hz steps in the cube
16 4.4.3 Evaluation method for the parts of sound variation detection system for IoTbased sound field detection
Figure 7 – FEM simulation of SPL spectra in the 3 744 Hz –4 256 Hz range with 4 Hz steps in the cube

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BS EN IEC 63364-1:2022
$102.76