BS IEC 62153-4-10:2015
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Metallic communication cable test methods – Electromagnetic compatibility (EMC). Transfer impedance and screening attenuation of feed-throughs and electromagnetic gaskets. Double coaxial test method
| Published By | Publication Date | Number of Pages |
| BSI | 2015 | 32 |
IEC 62153-4-10:2015(E) details a coaxial method suitable for determining the transfer impedance and/or screening attenuation of feed-throughs and electromagnetic gaskets. The shielded screening attenuation test set-up according to IEC 62153-4-4 (triaxial method) has been modified to take into account the particularities of feed-throughs and gaskets. This second edition cancels and replaces the first edition published in 2009. It constitutes a technical revision. The main technical changes with regard to the previous edition are as follows: – addition of a new clause that describes a procedure for verification of the measurement set-up and further information regarding sample preparation; – addition of a new Annex that describes how to improve measurement certainty in the very low frequency area.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 4 | CONTENTS |
| 6 | FOREWORD |
| 8 | 1 Scope 2 Normative references 3 Terms and definitions |
| 9 | Figures Figure 1 – A two-port Figure 2 – Equivalent circuit of the test set-up and definition of ZT |
| 11 | 4 Principle of the test method |
| 12 | Figure 3 – Cross-section of a typical feed-through configuration Figure 4 – Cross-section of the test fixture with a connector |
| 13 | Figure 5 – Cross-section of the test fixture with an electromagnetic gasket |
| 14 | 5 Procedure 5.1 Equipment 5.2 Dynamic range 5.3 Verification of the test set-up 5.4 Sample preparation 6 Measurement 6.1 General 6.2 Screening attenuation 6.3 Transfer impedance |
| 15 | 7 Expression of results 7.1 Transfer impedance 7.2 Screening attenuation 7.3 Requirements |
| 16 | Annex A (informative) Background for the measurement of the shielding effectiveness of feed-throughs and electromagnetic gaskets A.1 General Figure A.1 – Cross-section of a typical feed-through configuration |
| 17 | A.2 Theoretical model of the test procedure Figure A.2 – Cross-section of the test fixture with a connector Figure A.3 – Equivalent circuit of the test setup with the shunt admittance y of the feed-through |
| 18 | A.3 Performing measurements A.3.1 Characteristic impedance uniformity of the test fixture A.3.2 Measuring EMI-gaskets by using a NWA Figure A.4 – TDR step response at input-port of test fixture |
| 19 | A.3.3 Pictures and measurement results |
| 20 | Figure A.5 – View of the test fixture connected to a network analyzer Figure A.6 – Top view of the test fixture Figure A.7 – Detailed view of the contact area |
| 21 | Figure A.8 – Detailed view of the captivation for the conductive O-ring test |
| 22 | Figure A.9 – Isolation of the network analyzer Figure A.10 – Isolation of the test fixture when characterizing an ideal short (metal plate) |
| 23 | Figure A.11 – Measured operational screening transmission when characterizing a typical conductive O-ring Figure A.12 – Transfer impedance ZT of a typical conductive O-ring |
| 24 | Figure A.13 – Screening attenuation as of a typical conductive O-ring |
| 25 | Annex B (informative) Reference device for verification measurement B.1 General B.2 Design of the reference device Figure B.1 – Reference device, e.g. resistors soldered onto a PCB |
| 26 | B.3 Verification measurement result Figure B.2 – Typical verification measurement result |
| 27 | Annex C (informative) Impact of ground loops on low frequency measurements C.1 General C.2 Analysis of the test set-up Figure C.1 – Double coaxial test set-up |
| 28 | Figure C.2 – Equivalent circuits of the double coaxial test set-up |
| 29 | Figure C.3 – Results obtained with (green) and without ferrites on the test leads (blue) |
| 30 | Bibliography |
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