BS IEC 62529:2024
$215.11
Standard for Signal and Test Definition
| Published By | Publication Date | Number of Pages |
| BSI | 2024 | 360 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 4 | CONTENTS |
| 7 | FOREWORD |
| 12 | Important Notices and Disclaimers Concerning IEEE Standards Documents |
| 16 | Introduction |
| 18 | 1. Overview 1.1 Scope 1.2 Purpose 1.3 Word Usage |
| 19 | 1.4 Application 1.5 Annexes 2. Definitions, abbreviations, and acronyms 2.1 Definitions |
| 21 | 2.2 Abbreviations and acronyms |
| 22 | 3. Structure of this standard 3.1 Layers |
| 23 | 3.2 Signal Modeling Language (SML) layer 3.3 BSC layer |
| 24 | 3.4 TSF layer 3.5 Test requirement layer 3.6 Using the layers 4. Signals and SignalFunctions 4.1 Introduction |
| 25 | 4.2 Physical signal states |
| 26 | 4.3 Event states |
| 27 | 4.4 Digital stream states |
| 28 | 5. SML layer |
| 29 | 6. BSC layer 6.1 BSC layer base classes 6.2 General description of BSCs |
| 30 | 6.3 SignalFunction template |
| 31 | 7. TSF layer 7.1 TSF classes |
| 32 | 7.2 TSF signals defined by a model |
| 34 | 7.3 TSF signals defined by an external reference 8. Test procedure language (TPL) 8.1 Goals of the TPL |
| 35 | 8.2 Elements of the TPL 8.3 Use of the TPL 9. Maximizing test platform independence |
| 36 | Annexes Annex A (normative) Signal modeling language (SML) A.1 Use of the SML A.2 Introduction |
| 37 | A.3 Physical types |
| 40 | A.4 Signal definitions |
| 42 | A.5 Pure signals |
| 44 | A.6 Pure signal-combining mechanisms |
| 50 | A.7 Pure function transformations A.8 Measure, limiting, and sampling signals |
| 52 | A.9 Digital signals |
| 56 | A.10 Basic component SML |
| 82 | A.11 Fast Fourier analysis support |
| 84 | Annex B (normative) Basic signal components (BSC) layer B.1 BSC layer base classes B.2 BSC subclasses |
| 89 | B.3 Description of a BSC |
| 97 | B.4 Physical class |
| 109 | B.5 PulseDefns class |
| 110 | B.6 SignalFunction class |
| 169 | Annex C (normative) Dynamic signal descriptions C.1 Introduction |
| 170 | C.2 Basic classes |
| 178 | C.3 Dynamic signal goals and use cases |
| 180 | Annex D (normative) Interface definition language (IDL) basic components D.1 Introduction D.2 IDL BSC library |
| 181 | Annex E (informative)Test signal framework (TSF) for C/ATLAS E.1 Introduction E.2 TSF library definition in extensible markup language (XML) E.3 Interface definition language (IDL) for the TSF for C/ATLAS |
| 182 | E.4 AC_SIGNAL |
| 184 | E.5 AM_SIGNAL |
| 186 | E.6 DC_SIGNAL |
| 188 | E.7 DIGITAL_PARALLEL |
| 190 | E.8 DIGITAL_SERIAL |
| 192 | E.9 DIGITAL_TEST |
| 195 | E.10 DME_INTERROGATION |
| 198 | E.11 DME_RESPONSE |
| 201 | E.12 FM_SIGNAL |
| 204 | E.13 ILS_GLIDE_SLOPE |
| 207 | E.14 ILS_LOCALIZER |
| 210 | E.15 ILS_MARKER |
| 213 | E.16 PM_SIGNAL |
| 215 | E.17 PULSED_AC_SIGNAL |
| 217 | E.18 PULSED_AC_TRAIN |
| 219 | E.19 PULSED_DC_SIGNAL |
| 222 | E.20 PULSED_DC_TRAIN |
| 224 | E.21 RADAR_RX_SIGNAL |
| 226 | E.22 RADAR_TX_SIGNAL |
| 228 | E.23 RAMP_SIGNAL |
| 230 | E.24 RANDOM_NOISE |
| 232 | E.25 RESOLVER |
| 235 | E.26 RS_232 |
| 236 | E.27 SQUARE_WAVE |
| 238 | E.28 SSR_INTERROGATION |
| 241 | E.29 SSR_RESPONSE |
| 245 | E.30 STEP_SIGNAL |
| 247 | E.31 SUP_CAR_SIGNAL |
| 249 | E.32 SYNCHRO |
| 253 | E.33 TACAN |
| 257 | E.34 TRIANGULAR_WAVE_SIGNAL |
| 259 | E.35 VOR |
| 263 | Annex F (informative) Test signal framework (TSF) library for digital pulse classes F.1 Introduction F.2 TSF library definition in extensible markup language (XML) F.3 Graphical models of TSFs F.4 Pulse class family of TSFs |
| 280 | F.5 DTIF |
| 282 | Annex G (normative) Carrier language requirements G.1 Carrier language requirements G.2 Interface definition language (IDL) G.3 Datatypes |
| 288 | Annex H (normative) Test procedure language (TPL) H.1 TPL layer H.2 Elements of the TPL H.3 Structure of test requirements H.4 Carrier language H.5 Signal statements |
| 290 | H.6 Mapping of test statements to carrier language |
| 291 | H.7 Test statement definitions |
| 309 | H.8 Elements used in test statement definitions |
| 312 | H.9 Attributes with multiple properties |
| 316 | H.10 Transferring data in digital signals |
| 320 | H.11 Creating test requirements |
| 322 | H.12 Delimiting TPL statements |
| 324 | Annex I (normative) Extensible markup language (XML) signal descriptions I.1 Introduction |
| 325 | I.2 XSD for BSCs |
| 331 | I.3 XSD for TSFs |
| 339 | Annex J (informative) Support for ATLAS nouns and modifiers J.1 Signal and test definition (STD) support for ATLAS signals J.2 STD support for ATLAS nouns |
| 342 | J.3 STD support for C/ATLAS noun modifiers |
| 350 | J.4 Support for C/ATLAS extensions |
| 351 | Annex K (informative) Guide for maximizing test platform independence K.1 Introduction K.2 Guiding principles K.3 Best practice rules |
| 355 | Annex L (informative) IEEE download web-site material associated with this document |
| 356 | Annex M (informative) Bibliography |
| 358 | Participants |
