BS IEC 62951-2:2019
$86.31
Semiconductor devices. Flexible and stretchable semiconductor devices – Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
| Published By | Publication Date | Number of Pages |
| BSI | 2019 | 14 |
IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin?film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 4 | English CONTENTS |
| 5 | FOREWORD |
| 7 | 1 Scope 2 Normative references 3 Terms and definitions |
| 8 | 4 Test method 4.1 General |
| 9 | 4.2 Test of electrical characteristics before bending Figure 1 – Procedure for measurement of flexible thin-film transistor |
| 10 | 4.3 Test of electrical characteristics under bending Figure 2 – Schematic circuit diagram of the test |
| 11 | 4.4 Test report Figure 3 – Configuration for the TFT bending test |
| 12 | Bibliography |
