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BS IEC/IEEE 63195-2:2022

BS IEC/IEEE 63195-2:2022

$215.11

Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) – Computational procedure

Published By Publication Date Number of Pages
BSI 2022 78
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PDF Catalog

PDF Pages PDF Title
2 undefined
4 English
CONTENTS
8 FOREWORD
10 INTRODUCTION
11 1 Scope
2 Normative references
12 3 Terms and definitions
3.1 Exposure metrics and parameters
13 3.2 Spatial, physical, and geometrical parameters associated with exposure metrics
15 3.3 Test device technical operating and antenna parameters
3.4 Computational parameters
16 3.5 Uncertainty parameters
4 Symbols and abbreviated terms
4.1 Symbols
4.1.1 Physical quantities
17 4.1.2 Constants
4.2 Abbreviated terms
18 5 Overview and application of this document
5.1 Overview of the numerical evaluation
19 5.2 Application of this document
Figures
Figure 1 – Overview of the numerical power density evaluation procedure
20 5.3 Stipulations
6 Requirements on the numerical software
21 7 Model development and validation
7.1 General
7.2 Development of the numerical model of the DUT
22 7.3 Power normalization
24 7.4 Requirements on the experimental test equipment for model validation
7.4.1 General
Figure 2 – Power reference planes
25 7.4.2 Ambient conditions and device holder
7.4.3 Power measurement
26 7.5 Testing configurations for the validation of the DUT model
7.5.1 General
7.5.2 Tests to be performed
27 7.5.3 Determining the validity of the DUT model
7.5.4 Test reduction for additional DUTs
28 8 Power density computation and averaging
8.1 Evaluation surface
8.2 Tests to be performed and DUT configurations
8.2.1 General
29 8.2.2 Devices with a single radiating element or with multiple elements that do not operate simultaneously
8.2.3 Devices with antenna arrays or sub-arrays
Figure 3 – Example for configurations of radiating elementsas different antenna sub-arrays on the same DUT
30 8.2.4 Devices with multiple antennas or multiple transmitters
Figure 4 – Flow chart for the evaluation of power density forDUTs with antenna arrays or sub-arrays as described in 8.2.3
31 8.3 Considerations on the evaluation surface and dimensions of the computational domain
8.4 Averaging of power density on an evaluation surface
8.4.1 General
32 8.4.2 Construction of the averaging area on an evaluation surface
33 8.5 Computation of sPD by integration of the Poynting vector
8.5.1 General
8.5.2 Surface-normal propagation-direction power density into the evaluation surface, sPDn+
Figure 5 – Example of the construction of the averaging area withina sphere with fixed radius according to 8.4
34 8.5.3 Total propagating power density into the evaluation surface, sPDtot+
8.5.4 Total power density directed into the phantom considering near-field exposure, sPDmod+
35 8.6 Software
9 Uncertainty evaluation
9.1 General
9.2 Uncertainty of the sPD and of the mpsPD due to the computational parameters
9.2.1 Uncertainty contributions due to the computational parameters
36 9.2.2 Mesh resolution
Tables
Table 1 – Budget of the uncertainty contributions ofthe computational algorithm for the validation setup or testing setup
37 9.2.3 Absorbing boundary conditions
9.2.4 Power budget
9.2.5 Model truncation
9.2.6 Convergence
38 9.2.7 Dielectric properties
9.2.8 Lossy conductors
9.3 Uncertainty contribution of the computational representation of the DUT model
39 9.4 Uncertainty of the maximum exposure evaluation
Table 2 – Budget of the uncertainty of the developed model of the DUT
40 9.5 Uncertainty budget
Table 3 – Computational uncertainty budget
41 10 Reporting
43 Annex A (normative)Code verification
A.1 General
A.2 Interpolation and superposition of vector field components
44 Figure A.1 – Configuration of three λ/2 dipoles, D1, D2, and D3, for the evaluation of the interpolation and superposition of the electric field and magnetic field components
Table A.1 – Interpolation and superposition of vector field components; maximum permissible deviation from the reference results is 10 %
45 A.3 Computation of the far-field pattern and the radiated power
A.4 Implementation of lossy conductors
Table A.2 – Computation of PR; maximum permissible deviation fromthe reference results is 10 % for the radiated power and for the electric field amplitude of the far-field pattern
47 Figure A.2 – R320 waveguide
48 A.5 Implementation of anisotropic dielectrics
Figure A.3 – Cross section of the R320 waveguide showingthe locations of the Ey components to be recorded
Table A.3 – Minimum fine and coarse mesh step for used method
Table A.4 – Results of the evaluation of the computational dispersion characteristics
49 A.6 Computation of the sPD and psPD
A.6.1 General
Table A.5 – Results of the evaluation of the representation of anisotropic dielectrics
50 Table A.6 – Parameters for the incident power density distribution of Formula (A.4)
51 A.6.2 Planar surfaces
Figure A.4 – Si(x,y) computed with Formula (A.4) for the six parametersets of Table A.6 normalized to their maxima
52 A.6.3 Non-planar surfaces
53 Figure A.5 – Cross sections of the symmetric quarters of the testing geometries (SAR Stars) for the benchmarking of the power density averaging algorithm
Figure A.6 – Areas for the computation of the sPD on a cone of the SAR Star
54 A.7 Implementation of the field extrapolation according to the surface equivalence principle
55 Annex B (informative)Experimental evaluation of the radiated power
B.1 General
B.2 Direct conducted power measurements
Table B.1 – Comparison of the experimental methodsfor the evaluation of the radiated power
56 B.3 Radiated power measurement methods
B.4 Information provided by the DUT
57 Annex C (normative)Maximum-exposure evaluation techniques
C.1 General
C.2 Evaluation of EM fields radiated by each antenna element
58 C.3 Evaluation of the mpsPD by superposition of individual EM fields
C.3.1 General
C.3.2 Maximization over the entire codebook by exhaustive search
C.3.3 Optimization with fixed total conducted power
C.3.4 Optimization with fixed power at each port
60 Annex D (informative)Examples of the implementation of power density averaging algorithms
D.1 Example for the evaluation of the psPD on a planar surface
D.1.1 General
D.1.2 Evaluation of the psPD by direct construction of the averaging area
61 D.1.3 Example for the efficient evaluation of the psPD using an equidistant mesh on the evaluation surface
62 D.2 Example for the evaluation of the psPD on a non-planar surface
Figure D.1 – Rotated averaging area on the discretized evaluation surface (base mesh)
63 Figure D.2 – Reduction of the area of triangles thatare partially included in the averaging sphere
64 Annex E (informative)File format for exchange of field data
66 Annex F (informative)Rationales of the methods applied inIEC/IEEE 63195-1 and this document
F.1 Frequency range
F.2 Computation of sPD
F.2.1 Application of the Poynting vector for computation of incident power density
67 F.2.2 Averaging area
68 Annex G (informative)Square averaging area on non-planar evaluation surfaces
G.1 General
G.2 Example implementation for the evaluation of the psPD on a non-planar surface using square-shaped averaging area
69 Annex H (informative)Validation of the maximum-exposure evaluation techniques
H.1 General
H.2 Validation of the exhaustive search
H.2.1 Validation of the exhaustive search
H.2.2 Validation using reconstruction method
H.2.3 Validation of optimization with fixed total conducted power or with fixed power at each port
H.2.4 Validation of the maximum-exposure evaluation of measurement results
70 H.3 Example validation source for maximum-exposure evaluation validation
H.3.1 Description
Table H.1 – Main dimensions for the patch array stencil
Table H.2 – Main dimensions of the validation device
71 Figure H.1 – Main dimensions of patch array stencil
72 H.3.2 Positioning
Figure H.2 – Main dimensions of the validation device, including polypropylene casing
Figure H.3 – Validation device with SAM head in the tilt position
73 H.3.3 Nominal codebook, uncertainty and conducted power PR
H.3.4 Target values
Figure H.4 – Validation device with SAM head in the touch position
74 Table H.3 – Target values for validation device with the nominal codebook
Table H.4 – Target values for validation device with infinite codebook
75 Annex I (normative)Supplemental files and their checksums
76 Bibliography

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BS IEC/IEEE 63195-2:2022
$215.11