BS ISO 13320:2020
$198.66
Particle size analysis. Laser diffraction methods
Published By | Publication Date | Number of Pages |
BSI | 2020 | 68 |
This document provides guidance on instrument qualification and size distribution measurement of particles in many two-phase systems (e.g. powders, sprays, aerosols, suspensions, emulsions and gas bubbles in liquids) through the analysis of their light-scattering properties. It does not address the specific requirements of particle size measurement of specific materials.
This document is applicable to particle sizes ranging from approximately 0,1 µm to 3 mm. With special instrumentation and conditions, the applicable size range can be extended above 3 mm and below 0,1 µm.
For spherical and non-spherical particles, a size distribution is reported, where the predicted scattering pattern for the volumetric sum of spherical particles matches the measured scattering pattern. This is because the technique assumes a spherical particle shape in its optical model. For non-spherical particles the resulting particle size distribution is different from that obtained by methods based on other physical principles (e.g. sedimentation, sieving).
PDF Catalog
PDF Pages | PDF Title |
---|---|
2 | National foreword |
7 | Foreword |
8 | Introduction |
9 | 1 Scope 2 Normative references 3 Terms, definitions and symbols 3.1 Terms and definitions |
14 | 3.2 Symbols |
16 | 4 Principle 4.1 General 4.2 Theory |
17 | 4.3 Typical instrument and optical arrangement |
19 | 4.4 Measurement zone 4.5 Application and sample presentation |
20 | 4.6 Off-line measurements 4.7 In-line measurements 4.8 Online measurements |
21 | 4.9 At-line measurements 4.10 Scattering and detectors 5 Operational requirements and procedures 5.1 Instrument location 5.2 Dispersion gases |
22 | 5.3 Dispersion liquids 5.4 Sample inspection, preparation, dispersion and concentration 5.4.1 Sample inspection 5.4.2 Preparation 5.4.3 Dispersion |
23 | 5.4.4 Concentration 5.5 Measurement 5.5.1 Setting up instrument and blank measurement |
24 | 5.5.2 Sample preparation 5.5.3 Data collection of the scattering pattern 5.5.4 Selection of an appropriate optical model 5.5.5 Conversion of scattering pattern into PSD |
25 | 5.5.6 Robustness 5.6 Resolution and sensitivity 5.6.1 General 5.6.2 Resolution 5.6.3 Sensitivity and result variability |
26 | 6 Accuracy repeatability and instrument qualification 6.1 General |
27 | 6.2 Accuracy 6.2.1 Introduction 6.2.2 Accuracy test 6.3 Instrument repeatability 6.3.1 Introduction 6.3.2 Repeatability test |
28 | 6.4 Method repeatability 6.4.1 Introduction 6.4.2 Method repeatability test 6.5 Accuracy under intermediate precision conditions 6.5.1 General |
29 | 6.5.2 Intermediate precision conditions (general test) 7 Reporting of results 7.1 General 7.2 Sample |
30 | 7.3 Dispersion 7.4 Laser diffraction measurement 7.5 Analyst identification: |
32 | Annex A (informative) Theoretical background of laser diffraction |
49 | Annex B (informative) Advice on dispersion liquids |
50 | Annex C (informative) Dispersion methods — Recommendations |
52 | Annex D (informative) Instrument preparation — Recommendations |
54 | Annex E (informative) Error sources and diagnosis |
57 | Annex F (informative) Refractive index — Recommendations |
59 | Annex G (informative) Laser diffraction robustness and ruggedness |
62 | Annex H (normative) Certified reference materials, reference materials and comparison parameters |
65 | Bibliography |