BS ISO 15625:2014
$142.49
Silk. Electronic test method for defects and evenness of raw silk
| Published By | Publication Date | Number of Pages |
| BSI | 2014 | 26 |
This International Standard specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.
This International Standard is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | Foreword |
| 7 | Introduction |
| 9 | Section sec_1 Section sec_2 Section sec_3 Section sec_3.1 Section sec_3.2 Section sec_3.3 Section sec_3.4 Section sec_3.5 1 Scope 2 Normative references 3 Terms and definitions |
| 10 | Section sec_3.6 Section sec_3.7 Section sec_3.8 Section sec_3.9 Section sec_4 Section sec_5 Section sec_5.1 Section sec_5.2 Section sec_5.2.1 4 Principle 5 Apparatus |
| 11 | Section sec_5.2.2 Section sec_5.3 Section sec_5.4 Section sec_5.4.1 Section sec_5.4.2 Section sec_5.4.3 Section sec_6 Section sec_7 Section sec_7.1 Section sec_7.2 Section sec_7.2.1 Section sec_7.2.2 6 Atmospheres for conditioning and testing 7 Lot formation and sampling 7.1 Lot formation 7.2 Sampling |
| 12 | Section sec_8 Section sec_8.1 Section sec_8.1.1 Section sec_8.1.2 Section sec_8.1.3 Table tab_1 Section sec_8.2 Section sec_8.3 Section sec_8.3.1 Section sec_8.3.2 Section sec_8.4 Section sec_9 Section sec_9.1 8 Laboratory sample preparation 8.1 Raw silk in skein 8.2 Raw silk on cone 8.3 Soaked silk 8.4 Sampling length 9 Setting 9.1 Setting of the apparatus |
| 13 | Section sec_9.1.1 Section sec_9.1.2 Section sec_9.1.3 Section sec_9.1.4 Section sec_9.2 Section sec_10 Section sec_10.1 Section sec_10.2 Section sec_10.3 Section sec_10.4 Section sec_10.5 Section sec_10.6 Section sec_10.7 Section sec_10.8 Section sec_11 Section sec_11.1 9.2 Setting of the testing parameters of defects 10 Test procedure 11 Calculation and expression of test results |
| 14 | Section sec_11.2 Section sec_11.3 Section sec_11.4 Section sec_12 Section sec_13 12 Precision 13 Test report |
| 15 | Annex sec_A Annex sec_A.1 Annex sec_A.1.1 Figure fig_A.1 Annex sec_A.1.2 Annex A (normative) Defect counting and classification |
| 16 | Figure fig_A.2 Figure fig_A.3 Annex sec_A.1.3 |
| 17 | Annex sec_B Annex sec_B.1 Annex sec_B.2 Annex sec_B.3 Annex B (informative) Difference between the optical and capacitive sensors in detecting defects of raw silk |
| 18 | Annex sec_C Annex sec_C.1 Annex sec_C.1.1 Annex sec_C.1.2 Annex sec_C.2 Annex sec_C.2.1 Annex sec_C.2.2 Annex sec_C.2.3 Annex C (normative) Method for preparing soaked raw silk in lab |
| 19 | Annex sec_C.3 Annex sec_C.4 Annex sec_C.4.1 Annex sec_C.4.2 Annex sec_C.4.3 |
| 20 | Annex sec_D Table tab_D.1 Annex D (informative) An example of the electronic testing result sheet |
| 21 | Annex sec_E Table tab_E.1 Annex E (informative) Testing precision |
| 23 | Reference ref_1 Reference ref_2 Reference ref_3 Bibliography |
