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BS ISO 18118:2024

BS ISO 18118:2024

$142.49

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Published By Publication Date Number of Pages
BSI 2024 32
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PDF Catalog

PDF Pages PDF Title
2 undefined
6 Foreword
7 Introduction
9 1 Scope
2 Normative references
3 Terms and definitions
12 4 Symbols and abbreviated terms
13 5 General information
14 6 Measurement conditions
6.1 General
15 6.2 Excitation source
6.3 Energy resolution
6.4 Energy step and scan rate
6.5 Signal intensity
6.6 Gain and time constant (for AES instruments with analogue detection systems)
6.7 Modulation to generate a derivative spectrum
7 Data-analysis procedures
16 8 Spectrometer response function
9 Determination of chemical composition using relative sensitivity factors
9.1 Calculation of chemical composition
9.1.1 General
17 9.1.2 Composition determined from elemental relative sensitivity factors
9.1.3 Composition determined from atomic relative sensitivity factors or average matrix relative sensitivity factors
9.2 Uncertainties in calculated compositions
18 Annex A (informative) Formulae for relative sensitivity factors
24 Annex B (informative) Information on uncertainty of the analytical results
27 Bibliography

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BS ISO 18118:2024
$142.49