BS ISO 25498:2018
$189.07
Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 48 |
This document specifies the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. This document applies to test areas of micrometres and sub-micrometres in size. The minimum diameter of the selected area in a specimen which can be analysed by this method is restricted by the spherical aberration coefficient of the objective lens of the microscope and approaches several hundred nanometres for a modern TEM.
When the size of an analysed specimen area is smaller than that restriction, this document can also be used for the analysis procedure. But, because of the effect of spherical aberration, some of the diffraction information in the pattern can be generated from outside of the area defined by the selected area aperture. In such cases, the use of microdiffraction (nano-beam diffraction) or convergent beam electron diffraction, where available, might be preferred.
This document is applicable to the acquisition of SAED patterns from crystalline specimens, indexing the patterns and calibration of the diffraction constant.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 6 | Foreword |
| 8 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions |
| 11 | 4 Principle 4.1 General 4.2 Spot diffraction pattern |
| 14 | 4.3 Kikuchi pattern |
| 15 | 4.4 Polycrystalline specimen 5 Reference materials |
| 16 | 6 Equipment 7 Specimens 8 Experimental procedure 8.1 Instrument preparation |
| 17 | 8.2 Procedure for acquirement of selected area electron diffraction patterns |
| 20 | 8.3 Determination of diffraction constant, Lλ |
| 21 | 9 Measurement and solution of the SAED patterns 9.1 Selection of the basic parallelogram |
| 23 | 9.2 Indexing diffraction spots |
| 24 | 10 180° ambiguity 11 Uncertainty estimation 11.1 Factors affecting accuracy |
| 25 | 11.2 Calibration with a reference material |
| 26 | Annex A (informative) Interplanar spacing |
| 27 | Annex B (informative) Spot diffraction patterns of single crystals for BCC, FCC and HCP structure[7] |
| 46 | Bibliography |
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BS ISO 25498:2018 – TC:2020 Edition
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