BSI 18/30386543 DC:2018 Edition
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BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 28 |
| Status | Definitive |
|---|---|
| Pages | 28 |
| Publication Date | 2018-12-11 |
| Standard Number | 18/30386543 DC |
| Title | BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate |
| Identical National Standard Of | IEC 63229 Ed.1.0 |
| Descriptors | Substrates (insulating), Electrical equipment, Computer hardware, Components, Electrical components, Computer components, Common terms, Electronic equipment and components, Semiconductor technology |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
