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BSI DD ISO/TR 15969:2001

BSI DD ISO/TR 15969:2001

$102.76

Surface chemical analysis. Depth profiling. Measurement of sputtered depth

Published By Publication Date Number of Pages
BSI 2001 22
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Status

Withdrawn
Title

Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Publisher

BSI
Committee

CII/60
Pages

22
Publication Date

2001-10-01
Withdrawn Date

2021-03-26
Replaced By

PD ISO/TR 15969:2021
ISBN

0 580 38501 9
Standard Number

DD ISO/TR 15969:2001
Identical National Standard Of

ISO/TR 15969:2001
Descriptors

Chemical analysis and testing, Electron emission, Spectroscopy, Spectrochemical analysis, Surface properties, Depth, Dimensional measurement, Surface chemistry, Radiation measurement, X-rays, Profile measurement, Mass spectrometry, Control samples
ICS Codes 71.040.40 - Chemical analysis
BSI DD ISO/TR 15969:2001
$102.76