BSI PD 6595:1996
$142.49
Parameter extraction techniques for the European mini test chip
| Published By | Publication Date | Number of Pages |
| BSI | 1996 | 38 |
| Status | Withdrawn |
|---|---|
| Pages | 38 |
| Publication Date | 1996-05-15 |
| Withdrawn Date | 2004-05-01 |
| ISBN | 0 580 25604 9 |
| Standard Number | PD 6595:1996, CENELEC Report R117-006:1995 |
| Title | Parameter extraction techniques for the European mini test chip |
| Identical National Standard Of | CENELEC Report R117-006:1995 |
| Descriptors | Electronic equipment and components, Integrated circuits, Metal oxide semiconductors, Transistors, Test equipment, Digital integrated circuits, Microprocessor chips |
| Publisher | BSI |
| Committee | EPL/501 |
| ICS Codes | 31.200 - Integrated circuits. Microelectronics |
