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BSI PD CEN/CLC/TR 17603-10-12:2021

BSI PD CEN/CLC/TR 17603-10-12:2021

$215.11

Space engineering. Calculation of radiation and its effects and margin policy handbook

Published By Publication Date Number of Pages
BSI 2021 130
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This handbook is a part of the System Engineering branch and covers the methods for the calculation of radiation received and its effects, and a policy for design margins. Both natural and man-made sources of radiation (e.g. radioisotope thermoelectric generators, or RTGs) are considered in the handbook.

This handbook can be applied to the evaluation of radiation effects on all space systems.

This handbook can be applied to all product types which exist or operate in space, as well as to crews of on manned space missions.

This handbook complements to EN 16603-10-12 ā€œMethods for the calculation of radiation received and its effects and a policy for the design marginā€.

PDF Catalog

PDF Pages PDF Title
2 undefined
12 1 Scope
13 2 Terms, definitions and abbreviated terms
2.1 Terms from other documents
2.2 Terms specific to the present handbook
2.3 Abbreviated terms
14 3 Compendium of radiation effects
3.1 Purpose
16 3.2 Effects on electronic and electrical systems
3.2.1 Total ionising dose
3.2.2 Displacement damage
17 3.2.3 Single event effects
18 3.3 Effects on materials
3.4 Payload-specific radiation effects
19 3.5 Biological effects
3.6 Spacecraft charging
3.7 References
21 4 Margin
4.1 Introduction
4.1.1 Application of margins
22 4.2 Environment uncertainty
23 4.3 Effects parametersā€™ uncertainty
4.3.1 Overview
4.3.2 Shielding
24 4.3.3 Ionising dose calculation
4.3.4 Non-ionising dose (NIEL, displacement damage)
4.3.5 Single event effects
25 4.3.6 Effects on sensors
4.4 Testing-related uncertainties
4.4.1 Overview
4.4.2 Beam characteristics
4.4.3 Radioactive sources
26 4.4.4 Packaging
4.4.5 Penetration
4.4.6 Representativeness
4.5 Procurement processes and device reproducibility
27 4.6 Project management decisions
4.7 Relationship with derating
4.8 Typical design margins
4.9 References
28 5 Radiation shielding
5.1 Introduction
5.2 Radiation transport processes
5.2.1 Overview
5.2.2 Electrons
30 5.2.3 Protons and other heavy particles
34 5.2.4 Electromagnetic radiation ā€“ bremsstrahlung
35 5.3 Ionising dose enhancement
5.4 Material selection
5.5 Equipment design practice
5.5.1 Overview
36 5.5.2 The importance of layout
5.5.3 Add-on shielding
5.5.3.1 Introduction
37 5.5.3.2 On-PCB shielding
38 5.5.3.3 Whole box shielding
5.6 Shielding calculation methods and tools ā€“ Decision on using deterministic radiation calculations, detailed Monte Carlo simulations, or sector shielding analysis
47 5.7 Example detailed radiation transport and shielding codes
5.8 Uncertainties
48 5.9 References
50 6 Total ionising dose
6.1 Introduction
6.2 Definition
6.3 Technologies sensitive to total ionising dose
52 6.4 Total ionising dose calculation
6.5 Uncertainties
53 7 Displacement damage
7.1 Introduction
7.2 Definition
7.3 Physical processes and modelling
57 7.4 Technologies susceptible to displacement damage
7.4.1 Overview
58 7.4.2 Bipolar
59 7.4.3 Charge-coupled devices (CCD)
7.4.4 Active pixel sensors (APS)
60 7.4.5 Photodiodes
7.4.6 Laser diodes
7.4.7 Light emitting diode (LED)
7.4.8 Optocouplers
61 7.4.9 Solar cells
7.4.10 Germanium detectors
62 7.4.11 Glasses and optical components
7.5 Radiation damage assessment
7.5.1 Equivalent fluence calculation
7.5.2 Calculation approach
7.5.3 3-D Monte Carlo analysis
7.5.4 Displacement damage testing
63 7.6 NIEL rates for different particles and materials
70 7.7 Uncertainties
7.8 References
72 8 Single event effects
8.1 Introduction
73 8.2 Modelling
8.2.1 Overview
8.2.2 Notion of LET (for heavy ions)
8.2.3 Concept of cross section
74 8.2.4 Concept of sensitive volume, critical charge and effective LET
75 8.3 Technologies susceptible to single event effects
8.4 Test methods
8.4.1 Overview
8.4.2 Heavy ion beam testing
76 8.4.3 Proton and neutron beam testing
8.4.4 Experimental measurement of SEE sensitivity
77 8.4.5 Influence of testing conditions
8.4.5.1 Overview
8.4.5.2 Energy and track structure dependence
78 8.4.5.3 Angle effect on device response
8.4.5.4 Pattern influence
79 8.5 Hardness assurance
8.5.1 Rate prediction
8.5.2 Prediction of SEE rates for ions
81 8.5.3 Improvements
82 8.5.4 Method synthesis
8.5.5 Prediction of SEE rates of protons and neutrons
84 8.5.6 Method synthesis
8.5.7 Calculation toolkit
8.5.8 Applicable derating and mitigating techniques
8.5.9 Analysis at system level
85 8.6 Destructive SEE
8.6.1 Single event latch-up (SEL) and single event snapback (SESB)
8.6.1.1 Definition
8.6.1.2 Sensitive devices
8.6.1.3 Modelling
86 8.6.1.4 Test method
8.6.1.5 Hardness Assurance
8.6.1.6 Prediction issues in case of SEL
87 8.6.2 Single event gate rupture (SEGR) and single event dielectric rupture (SEDR)
8.6.2.1 Definition
8.6.2.2 Sensitive devices
8.6.2.3 Modelling
8.6.2.4 Test method
88 8.6.2.5 Hardness Assurance
8.6.3 Single event burnout (SEB)
8.6.3.1 Definition
8.6.3.2 Sensitive devices
8.6.3.3 Modelling
8.6.3.4 Test method
8.6.3.5 Hardness Assurance
89 8.7 Non-destructive SEE
8.7.1 Single event upset (SEU)
8.7.1.1 Definition
8.7.1.2 Sensitive devices
8.7.1.3 Modelling
8.7.1.4 Test method
8.7.1.5 Hardness assurance
8.7.2 Multiple-cell upset (MCU) and single word multiple-bit upset (SMU)
8.7.2.1 Definitions
90 8.7.2.2 Devices susceptible to MCU
8.7.2.3 Modelling
8.7.2.4 Test
91 8.7.2.5 Hardness assurance
8.7.3 Single event functional interrupt (SEFI)
8.7.3.1 Definition
8.7.3.2 Susceptible components
8.7.3.3 Modelling
8.7.3.4 Test method
8.7.3.5 Hardness assurance
92 8.7.4 Single event hard error (SEHE)
8.7.4.1 Definition
8.7.4.2 Devices susceptible to SEHE
8.7.4.3 Modelling
8.7.4.4 Test method
93 8.7.4.5 Hardness assurance
8.7.5 Single event transient (SET) and single event disturb (SED)
8.7.5.1 Definition
8.7.5.2 Sensitive devices
94 8.7.5.3 Modelling
8.7.5.4 Test method
8.7.5.5 Hardness assurance
8.8 References
98 9 Radiation-induced sensor backgrounds
9.1 Introduction
9.2 Background in ultraviolet, optical and infrared imaging sensors
102 9.3 Background in charged particle detectors
9.4 Background in X-ray CCDs
103 9.5 Radiation background in gamma-ray instruments
106 9.6 Photomultipliers tubes and microchannel plates
107 9.7 Radiation-induced noise in gravity-wave detectors
9.8 Other problems common to detectors
108 9.9 References
110 10 Effects in biological material
10.1 Introduction
10.2 Quantities used in radiation protection work
10.2.1 Overview
111 10.2.2 Protection quantities
113 10.2.3 Operational quantities
115 10.3 Radiation effects in biological systems
10.3.1 Overview
116 10.3.2 Source of data
10.3.3 Early effects
117 10.3.4 Late effects
10.3.4.1 Overview
10.3.4.2 Stochastic late effects
118 10.3.4.3 Deterministic late effects
119 10.4 Radiation protection limits in space
10.4.1 Overview
10.4.2 International agreements
120 10.4.3 Other considerations in calculating crew exposure
10.4.4 Radiation limits used by the space agencies of the partners of the International Space Station (ISS)
10.4.4.1 Proposed CSA Limits
121 10.4.4.2 Proposed ESA Limits
10.4.4.3 Proposed NASA limits
122 10.4.4.4 Proposed JAXA Limits
123 10.4.4.5 Proposed RSA Limits
124 10.5 Uncertainties
10.5.1 Overview
10.5.2 Spacecraft shielding interactions
10.5.3 The unique effects of heavy ions
125 10.5.4 Extrapolation from high-dose effects to low-dose effects
10.5.5 Variability in composition, space and time
10.5.6 Effects of depth-dose distribution
10.5.7 Influence of spaceflight environment
127 10.5.8 Uncertainties summary
10.6 References

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BSI PD CEN/CLC/TR 17603-10-12:2021
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