BSI PD IEC/PAS 62276:2002

$167.15

Single crystal wafers applied for surface acoustic wave device. Specification and measuring method

Published By	Publication Date	Number of Pages
BSI	2002	40

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Description

Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators. Lays down specifications and measuring methods.

Additional information

Status	Withdrawn
Title	Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
Publisher	BSI
Committee	W/-
Pages	40
Publication Date	2002-02-05
Withdrawn Date	2006-02-14
Replaced By	BS EN 62276:2005
ISBN	0 580 38980 4
Standard Number	PD IEC/PAS 62276:2002
Identical National Standard Of	IEC PAS 62276:2001
Descriptors	Crystals (electronic), Acoustoelectric devices, Acoustic waves, Electronic equipment and components, Crystal resonators, Acoustic filters, Resonators, Electromechanical filters, Dielectric devices, Lithium, Electrical wave measurement, Acoustic measurement, Quartz, Acoustic wave devices, Piezoelectric devices, Substrates (insulating)
ICS Codes	31.140 - Piezoelectric devices

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BSI PD IEC/PAS 62276:2002

$167.15


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