BSI PD IEC TR 61000-1-1:2023
$189.07
Electromagnetic compatibility (EMC) – General. Application and interpretation of fundamental definitions and terms
Published By | Publication Date | Number of Pages |
BSI | 2023 | 46 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
2 | undefined |
4 | CONTENTS |
6 | FOREWORD |
9 | 1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions |
12 | 3.2 Abbreviated terms 4 The electromagnetic environment 4.1 General |
13 | 4.2 Coupling between emitting and susceptible devices Figures Figure 1 – Coupling paths between emitting and susceptible devices |
14 | 5 Application of EMC terms and definitions 5.1 General 5.2 Relation between various types of levels 5.2.1 Emissions and immunity level (and limit) |
15 | 5.2.2 Compatibility level Figure 2 – Limits and levels for a single emitter and susceptible deviceas a function of some independent variable (e.g., frequency) Figure 3 – Emission/immunity limits and compatibility levels, with an example of emission/immunity levels for a single emitter and susceptible device as a functionof some independent variable (e.g., frequency) |
16 | 5.2.3 Examples to illustrate the concepts of using levels and limits |
17 | Figure 4 – Compatibility levels Uc for the odd harmonics in a public low-voltage network and examples of associated emission and immunity limits |
18 | 5.3 Probability aspects and margins 5.3.1 Compatibility levels and uncertainties |
19 | 5.3.2 Standardized test Figure 5 – Limits, compatibility levels and margins, as a functionof any independent variable (e.g., frequency) |
20 | 5.3.3 In situ test – Superposition Figure 6 – Example of the probability densities for an emission level andan immunity level, at one single value of the independent variable |
22 | 5.3.4 Lack of data Figure 7 – Example of superposition of disturbances Figure 8 – Example of probability densities for an ultimate disturbance level(the sum of disturbance levels produced by various emitters) and the immunitylevels of two types of susceptible device |
23 | 6 Models and their limitations 6.1 General 6.2 Source models 6.2.1 Conducted emissions |
24 | 6.2.2 Radiated emissions Figure 9 – Source model for conducted emissions(source loaded by ZL1 and ZL2) |
25 | 6.3 Coupling models 6.3.1 General 6.3.2 Common impedance coupling Figure 10 – Electric and magnetic dipole elements |
26 | 6.3.3 Coupling by induction |
27 | Figure 11 – Capacitance per unit length as a function of conductor separation |
28 | Figure 12 – Flux density from parallel conductors |
29 | 6.3.4 Radiative coupling 6.4 Susceptible device models |
30 | Annex A (informative)Interpretation of EMC terms and definitions A.1 General A.2 Units and decibels |
31 | A.3 Electromagnetic interference, compatibility and environment A.3.1 General A.3.2 Electromagnetic interference (EMI) Figure A.1 – The basic form of an EMI problem |
32 | A.3.3 Electromagnetic compatibility (EMC) A.3.4 The electromagnetic environment Figure A.2 – Subdivision of EMC in its key aspects |
33 | A.4 Susceptibility/immunity A.5 Level and limit |
34 | A.6 Emission and immunity |
36 | A.7 Compatibility level and margin Figure A.3 – Overview of various EMC terms and measuring conditions |
37 | Figure A.4 – Examples of probability densities p(D), p(I) and the resulting p(I – D) |
39 | Annex B (informative)Standardized and in situ tests |
40 | Annex C (informative)Review of the historical assignment of radiated disturbance degrees C.1 General C.2 Theoretical analysis of radiated disturbance degrees Table C.1 – Radiated disturbance degrees |
41 | Figure C.1 – Problem geometry |
42 | C.3 Detailed derivations C.3.1 Derivation of Formula (C.4) |
43 | C.3.2 Derivation of Formula (C.5) |
45 | Bibliography |