BSI PD IEC/TR 61000-4-38:2015
$142.49
Electromagnetic compatibility (EMC) – Testing and measurement techniques. Test, verification and calibration protocol for voltage fluctuation and flicker compliance test systems
| Published By | Publication Date | Number of Pages |
| BSI | 2015 | 30 |
This part of IEC 61000 , which is a Technical Report, defines a test protocol for flicker test systems designed to perform compliance tests in accordance with IEC 61000‑3‑3 and IEC 61000‑3‑11 . It is intended to provide test system manufacturers and testing laboratories with systematic methods to determine if the flicker test system meets the IEC design specifications for a wide range of voltage fluctuations and fluctuation frequencies, as specified in IEC 61000‑4‑15:2010, Table 5, that have been observed in product testing.
This protocol is intended to be compatible with related standards, in particular with any requirements set forth by listing organizations or measurement standards of the IEC. Meeting the criteria defined herein should not be construed as a waiver of any other relevant performance or safety requirements.
The main purpose of this technical report is to provide guidance and methods for periodic calibration and verification of systems consisting of previously type tested equipment. For complete flicker test systems that exhibit deviations of less than 5 % from the specifications of this protocol, it can be assumed that individual components are performing properly and separate calibration of individual system components is therefore not necessary.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 4 | CONTENTS |
| 6 | FOREWORD |
| 8 | INTRODUCTION |
| 9 | 1 Scope 2 Normative references |
| 10 | 3 Terms and definitions 4 General 5 Objectives of flicker and voltage fluctuations test protocols |
| 11 | 6 Manufacturer’s or owner’s information required 7 Performance criteria |
| 12 | Tables Table 1 – Calibration points from IEC 61000-4-15:2010, Table 5 |
| 13 | 8 General test guidelines 8.1 General 8.2 Essential information Table 2 – Summary of tests to verify/calibrate flicker test systems |
| 14 | 9 Test equipment and accuracy |
| 15 | 10 Detailed test procedures 10.1 Procedures common to all tests |
| 16 | 10.2 Test no. 1 – Simple power source qualification test 10.2.1 Rationale 10.2.2 Test procedure |
| 17 | 10.3 Test no. 2 – Verification of the Zref and/or Ztest impedance 10.3.1 Rationale 10.3.2 Test procedure Figures Figure 1 – Illustration showing a rectangular 8 A current modulation pattern at 7 CPM |
| 18 | 10.4 Tests no. 3 to 6 – Low frequency rectangular modulation rates of 1 CPM to 39 CPM 10.4.1 Rationale 10.4.2 Test procedure Figure 2 – Illustration showing the method to determine the inductance of Zref or Ztest |
| 19 | 10.5 Tests no. 7 to 9 – High frequency rectangular modulation rates of 110 CPM and up 10.5.1 Rationale 10.5.2 Test procedure Figure 3 – Illustration showing a rectangular modulation pattern at 3,166 7 Hz |
| 20 | 10.5.3 Uncertainties of this protocol, and methods to verify modulation accuracy Figure 4 – Illustration showing a rectangular modulation pattern at 1 052 CPM |
| 22 | Annex A (normative) Requirements for external test equipment to verify modulation accuracy |
| 23 | Annex B (informative) Example test setup for modulation load unit Figure B.1 – Typical test setup for tests 1 to 9 |
| 24 | Annex C (informative) Some typical flicker test system integration issues to avoid Figure C.1 – Single phase arrangement with excessive or near “zero” impedance |
| 25 | Figure C.2 – Single phase arrangement with sense lines present Figure C.3 – Single phase arrangement with connecting lines to power analyzer |
| 26 | Figure C.4 – Neutral impedance bypassed externally |
| 27 | Bibliography |
