BSI PD ISO/TR 18196:2016:2017 Edition
$198.66
Nanotechnologies. Measurement technique matrix for the characterization of nano-objects
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 68 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 10 | Foreword |
| 11 | Introduction |
| 13 | 1 Scope 2 Normative references 3 Terms and definitions 3.1 General terms |
| 14 | 3.2 Nano-object parameters |
| 15 | 4 Parameters included in the matrix |
| 17 | 5 Measurement techniques included in the matrix 5.1 General 5.2 Acoustic spectroscopy 5.2.1 Description |
| 18 | 5.2.2 Nano-object parameters 5.2.3 Advantages 5.2.4 Limitations 5.2.5 Measurand 5.2.6 Relevant standards 5.3 Analytical centrifugation (AC) 5.3.1 Description |
| 19 | 5.3.2 Nano-object parameters 5.3.3 Advantages 5.3.4 Limitations 5.3.5 Measurand 5.3.6 Relevant standards 5.4 Electroacoustic spectroscopy 5.4.1 Description 5.4.2 Nano-object parameters |
| 20 | 5.4.3 Advantages 5.4.4 Limitations 5.4.5 Measurand 5.4.6 Relevant standards 5.5 Aerosol particle mass analyser (AMS) 5.5.1 Description |
| 21 | 5.5.2 Nano-object parameters 5.5.3 Advantages 5.5.4 Limitations 5.5.5 Measurand 5.5.6 Relevant standards 5.6 Auger electron spectroscopy (AES) 5.6.1 Description 5.6.2 Nano-object parameters |
| 22 | 5.6.3 Advantages 5.6.4 Limitations 5.6.5 Measurand 5.6.6 Relevant standards 5.7 Brunauer-Emmett-Teller (BET) method for physical adsorption — Surface area determination 5.7.1 Description |
| 23 | 5.7.2 Nano-object parameters 5.7.3 Advantages 5.7.4 Limitations 5.7.5 Measurand 5.7.6 Relevant standards 5.8 Condensation particle counter (CPC) 5.8.1 Description |
| 24 | 5.8.2 Nano-object parameters 5.8.3 Advantages 5.8.4 Limitations 5.8.5 Measurand 5.8.6 Relevant standards 5.9 Differential mobility analysis system (DMAS) 5.9.1 Description |
| 25 | 5.9.2 Nano-object parameters 5.9.3 Advantages 5.9.4 Limitations 5.9.5 Measurand 5.9.6 Relevant standards 5.10 Differential scanning calorimetry (DSC) 5.10.1 Description 5.10.2 Nano-object parameters 5.10.3 Advantages |
| 26 | 5.10.4 Limitations 5.10.5 Measurand 5.10.6 Relevant standards 5.11 Dynamic light scattering (DLS) 5.11.1 Description |
| 27 | 5.11.2 Nano-object parameters 5.11.3 Advantages 5.11.4 Limitations 5.11.5 Measurand 5.11.6 Relevant standards |
| 28 | 5.12 Electron energy loss spectroscopy (transmission EELS) 5.12.1 Description 5.12.2 Nano-object parameters 5.12.3 Advantages 5.12.4 Limitations 5.12.5 Measurand 5.12.6 Relevant standards 5.13 Electrophoresis/capillary electrophoresis 5.13.1 Description |
| 30 | 5.13.2 Nano-object parameters 5.13.3 Advantages 5.13.4 Limitations 5.13.5 Measurands 5.13.6 Relevant standards 5.14 Energy dispersive X-ray spectrometry (EDS/EDX and WDS) 5.14.1 Description 5.14.2 Nano-object parameters |
| 31 | 5.14.3 Advantages 5.14.4 Limitations 5.14.5 Measurand 5.14.6 Relevant standards 5.15 Field flow fractionation (FFF) 5.15.1 Description 5.15.2 Nano-object parameters |
| 32 | 5.15.3 Advantages 5.15.4 Limitations 5.15.5 Measurand 5.15.6 Relevant standards 5.16 Fluorescence spectroscopy 5.16.1 Description 5.16.2 Nano-object parameters 5.16.3 Advantages |
| 33 | 5.16.4 Limitations 5.16.5 Measurand 5.16.6 Relevant standards 5.17 Fourier transform infrared (FT-IR) spectroscopy and FT-IR imaging 5.17.1 Description 5.17.2 Nano-object parameters 5.17.3 Advantages |
| 34 | 5.17.4 Limitations 5.17.5 Measurand 5.17.6 Relevant standards for FT-IR 5.18 Induced grating method (IG) 5.18.1 Description 5.18.2 Nano-object parameters 5.18.3 Advantages 5.18.4 Limitations |
| 35 | 5.18.5 Measurand 5.18.6 Relevant standards 5.19 Inductively coupled plasma–mass spectrometry (ICP-MS) and single particle inductively coupled plasma–mass spectrometry (SP-ICP-MS) 5.19.1 Description 5.19.2 Nano-object parameters 5.19.3 Advantages 5.19.4 Limitations |
| 36 | 5.19.5 Measurand 5.19.6 Relevant standards 5.19.7 Nano-hyphenated ICP/MS techniques |
| 37 | 5.20 Laser diffraction 5.20.1 Description 5.20.2 Nano-object parameters 5.20.3 Advantages 5.20.4 Limitations 5.20.5 Measurand 5.20.6 Relevant standards |
| 38 | 5.21 Liquid chromatography–mass spectrometry (LC-MS) 5.21.1 Description 5.21.2 Nano-object parameters 5.21.3 Advantages 5.21.4 Limitations 5.21.5 Measurand 5.21.6 Relevant standards 5.22 Particle tracking analysis (PTA) 5.22.1 Description |
| 39 | 5.22.2 Nano-object parameters 5.22.3 Advantages 5.22.4 Limitations 5.22.5 Measurand |
| 40 | 5.22.6 Relevant standards 5.23 Optical absorption spectroscopy (UV/Vis/NIR) 5.23.1 Description 5.23.2 Nano-object parameters 5.23.3 Advantages 5.23.4 Limitations |
| 41 | 5.23.5 Measurand 5.23.6 Relevant standards for 5.24 Quartz crystal microbalance (QCM) 5.24.1 Description 5.24.2 Nano-object parameters 5.24.3 Advantages 5.24.4 Limitations 5.24.5 Measurand 5.24.6 Relevant standards |
| 42 | 5.25 Raman spectroscopy/Raman imaging 5.25.1 Description 5.25.2 Nano-object parameters 5.25.3 Advantages 5.25.4 Limitations 5.25.5 Measurand 5.25.6 Relevant standards for Raman |
| 43 | 5.26 Resonant mass measurement (RMM) 5.26.1 Description 5.26.2 Nano-object parameters 5.26.3 Advantages 5.26.4 Limitations 5.26.5 Measurand 5.26.6 Relevant standards 5.27 Scanning electron microscopy (SEM) 5.27.1 Description |
| 44 | 5.27.2 Nano-objects parameters 5.27.3 Advantages 5.27.4 Limitations |
| 45 | 5.27.5 Measurand 5.27.6 Relevant standards 5.28 Scanning probe microscopy (SPM) 5.28.1 Description |
| 46 | 5.28.2 Nano-object parameters 5.28.3 Advantages 5.28.4 Limitations |
| 47 | 5.28.5 Measurand(s) 5.28.6 Relevant standards 5.29 Secondary ion mass spectrometry (SIMS) and Time of Flight SIMS (TOF-SIMS) 5.29.1 Description 5.29.2 Nano-object parameters 5.29.3 Advantages |
| 48 | 5.29.4 Limitations 5.29.5 Measurand 5.29.6 Relevant standards 5.30 Small angle X-ray scattering (SAXS) 5.30.1 Description 5.30.2 Nano-object parameters |
| 49 | 5.30.3 Advantages 5.30.4 Limitations 5.30.5 Measurand |
| 50 | 5.30.6 Relevant standards 5.31 Static light scattering (SLS) and static multiple light scattering (SMLS) 5.31.1 Description 5.31.2 Nano-object parameters 5.31.3 Advantages |
| 51 | 5.31.4 Limitations 5.31.5 Measurands (SLS) 5.31.6 Measurands (SMLS) 5.31.7 Relevant standards 5.32 Single particle light interaction methods 5.32.1 Description |
| 52 | 5.32.2 Nano-object parameters 5.32.3 Advantages 5.32.4 Limitations 5.32.5 Measurand 5.32.6 Relevant standards 5.33 Thermogravimetric analysis (TGA) 5.33.1 Description 5.33.2 Nano-object parameters 5.33.3 Advantages |
| 53 | 5.33.4 Limitations 5.33.5 Measurand 5.33.6 Relevant standards 5.33.7 Hyphenated TGA techniques 5.34 Transmission electron microscopy (TEM) 5.34.1 Description 5.34.2 Nano-object parameters |
| 54 | 5.34.3 Advantages 5.34.4 Limitations 5.34.5 Measurand 5.34.6 Relevant standards |
| 55 | 5.35 X-ray diffraction (XRD) 5.35.1 Description 5.35.2 Nano-object parameters 5.35.3 Advantages 5.35.4 Limitations 5.35.5 Measurand 5.35.6 Relevant standards |
| 56 | 5.36 X-ray photoelectron spectroscopy (XPS) 5.36.1 Description 5.36.2 Nano-object parameters 5.36.3 Advantages 5.36.4 Limitations 5.36.5 Measurand 5.36.6 Relevant standards |
| 58 | Annex A (informative) Sample separation/preparation |
| 61 | Bibliography |
