IEC 60749-5:2003
$13.65
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
| Published By | Publication Date | Number of Pages |
| IEC | 2003-01-17 | 22 |
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
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