IEC 61163-1:2006

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Reliability stress screening – Part 1: Repairable assemblies manufactured in lots

Published By	Publication Date	Number of Pages
IEC	2006-06-26	170

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Categories: 03.120.01 - Quality in general, 03.120.30 - Application of statistical methods, 21.020 - Characteristics and design of machines, apparatus, equipment, IEC

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Description

This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.

Additional information

Published Code	IEC
Published By	International Electrotechnical Commission
Publication Date	2006-06-26
Pages Count	170
Language	France
Edition	2.0
File Size	1.5 MB
ICS Codes	03.120.01 - Quality in general 03.120.30 - Application of statistical methods 21.020 - Characteristics and design of machines, apparatus, equipment

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IEC 61163-1:2006

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