IEC 61164:2004

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Reliability growth – Statistical test and estimation methods

Published By	Publication Date	Number of Pages
IEC	2004-03-24	116

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Categories: 03.120.01 - Quality in general, 03.120.30 - Application of statistical methods, IEC

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Description

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
– addition of two statistical models for reliability growth planning and tracking in the product design phase;
– statistical methods for the reliability growth programme in the design phase of IEC 61014;
– addition of the discrete reliability growth model for the test phase;
– addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
– addition of real lif examples for most of the statistical models;
– numerical correction of tables in the reliability growth test example.

This publication is to be read in conjunction with IEC 61014:2003.

Additional information

Published Code	IEC
Published By	International Electrotechnical Commission
Publication Date	2004-03-24
Pages Count	116
Language	France
Edition	2.0
File Size	839.7 KB
ICS Codes	03.120.01 - Quality in general 03.120.30 - Application of statistical methods

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IEC 61164:2004

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