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IEC 62047-40:2021

IEC 62047-40:2021

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Semiconductor devices – Micro-electromechanical devices – Part 40:Test methods of micro-electromechanical inertial shock switch threshold

Published By Publication Date Number of Pages
IEC 2021-09-03 16
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IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.

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IEC 62047-40:2021
$13.00