IEC TR 62878-2-2:2015
$22.75
Device embedded substrate – Part 2-2: Guidelines – Electrical testing
| Published By | Publication Date | Number of Pages |
| IEC | 2015-12-04 | 34 |
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
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