IEC TR 63133:2017
$33.15
Semiconductor devices – Scan based ageing level estimation for semiconductor devices
| Published By | Publication Date | Number of Pages |
| IEC | 2017-10-11 | 22 |
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
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