IEC TS 62396-5:2008
$43.55
Process management for avionics – Atmospheric radiation effects – Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems
| Published By | Publication Date | Number of Pages |
| IEC | 2008-08-19 | 22 |
IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).
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