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IEEE 1658-2023

$67.17

IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices (Published)

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IEEE 2023
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Revision Standard – Active. Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.

PDF Catalog

PDF Pages PDF Title
1 IEEE Std 1658™-2023 Front cover
2 Title page
4 Important Notices and Disclaimers Concerning IEEE Standards Documents
8 Participants
Introduction
11 Contents
13 List of Figures
15 List of Tables
16 1. Overview
1.1 Scope
1.2 Purpose
1.3 Word usage
17 1.4 Discussion of scope and purpose
1.5 Digital-to-analog converter and analog-to-digital converter differences and similarities
19 1.6 Digital-to-analog converter background
26 1.7 Guidance to the user
30 1.8 Manufacturer supplied information
32 2. Normative references
33 3. Definitions, symbols, acronyms, and abbreviations
3.1 Definitions
41 3.2 Symbols
43 3.3 Acronyms and abbreviations
44 4. Test methods
4.1 General comments on test methods
4.2 Test setup
45 4.3 Static testing
46 4.4 Dynamic testing
48 4.5 Taking a waveform
49 5. Fitting sine waves
5.1 Curve fitting test method
50 5.2 Choice of frequencies and waveform epoch
5.3 Fine-scale frequency selection
5.4 Medium-scale frequency selection
5.5 Coarse-scale frequency selection
51 5.6 Selecting signal amplitudes
6. Digital input
6.1 Coding
6.2 Clock and data feedthrough
52 6.3 Static input parameters
53 6.4 Timing parameters
7. Analog inputs
7.1 Comments on analog inputs
54 8. Analog output (single-ended and differential)
8.1 Figure 21—Block diagram of DAC topologies
8.2 Output impedance
55 8.3 Short-circuit current
56 8.4 Compliance voltage for current-output DACs
8.5 Load current for voltage-output DACs
57 8.6 Maximum usable dynamic range
9. Gain and offset (static and dynamic)
9.1 Static gain and offset (independently based)
58 9.2 Static gain and offset (terminally based)
59 9.3 Dynamic gain and offset
10. G(f) is the dynamic gain of the DAC at frequency f.Linearity (static and dynamic)
10.1 Integral nonlinearity
60 10.2 Differential nonlinearity
10.3 Monotonicity
10.4 Spurious free dynamic range (SFDR)
63 11. Noise
64 11.1 Signal-to-noise and distortion ratio
68 11.2 Signal-to-noise ratio
69 11.3 1/f Noise
70 11.4 Effective number of bits
72 11.5 Noise power ratio
12. Harmonic and spurious distortion
12.1 Total harmonic distortion
74 12.2 Intermodulation distortion
12.3 Glitches
77 13. Step response parameters
13.1 General comments on step response parameters
13.2 Test method for acquiring an estimate of the step response
78 13.3 Slew rate limit
13.4 Settling time parameters
81 13.5 Transition duration
82 13.6 Overshoot and precursors
14. Interference-related DAC parameters
14.1 Multitone power ratio
83 14.2 Crosstalk (channel separation, channel isolation)
86 14.3 Channel matching
14.4 Channel skew
87 15. Frequency response parameters
15.1 General comments on frequency response parameters
88 15.2 Reference input bandwidth
89 15.3 Digital-to-analog-conversion frequency response
94 16. Power supply parameters
16.1 Power supply currents
16.2 Power supply voltage effects
96 16.3 Ground currents
98 Annex A (informative) DAC architectures
A.1 Binary weighted
100 A.2 Segmented
A.3 R-2R
101 A.4 Delta-Sigma
102 A.5 PWM DAC
103 A.6 Multiple DAC architecture
104 Annex B (informative) Sine-wave fitting algorithms
B.1 An algorithm for three-parameter (known frequency) least-squares fit to sine wave data using matrix operations
105 B.2 An algorithm for four-parameter (general use) least-squares fit to sine-wave data using matrix operations
108 Annex C (informative) Discrete Fourier transforms and windowing
C.1 Discrete Fourier transforms and windowing
109 C.2 Windowed DFT
C.3 Spectral averaging
110 C.4 Spectral leakage
C.5 Coherent sampling, sine fitting, and other means of dealing with spectral leakage
111 C.6 Useful windows and their characteristics
112 A.1 Choosing a window
113 Annex D (informative) Bibliography
115 Back cover
IEEE 1658-2023
$67.17