IEEE 1671-2006
$62.83
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Published By | Publication Date | Number of Pages |
IEEE | 2006 |
New IEEE Standard – Superseded. This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | IEEE Std 1671-2006 Front Cover |
3 | Title Page |
6 | Introduction Notice to users Laws and regulations Copyrights |
7 | Updating of IEEE documents Errata Interpretations Patents |
8 | Participants |
10 | Contents |
11 | Important Notice 1. Overview 1.1 Scope 1.2 Purpose |
12 | 1.3 Application 1.4 Conventions used within this document |
13 | 2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
15 | 3.2 Acronyms and abbreviations |
16 | 4. Automatic Test Markup Language 4.1 Background 4.2 Purpose 4.3 ATML and the product life cycle |
19 | 4.4 ATML framework |
21 | 4.5 Specification techniques |
23 | 4.6 ATML component standards |
25 | 4.7 XML schema names and locations |
26 | 5. Conformance 6. Extensibility |
27 | Annex A (normative) XML schema style guidelines |
35 | Annex B (normative) ATML common element schemas |
88 | Annex C (informative) Architecture examples |
94 | Annex D (informative) Glossary |
97 | Annex E (informative) Bibliography |